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Measurement of NOx concentration at ppb level in high-purity gases based on chemiluminescence method
期刊论文
ACTA PHYSICA SINICA, 2022, 卷号: 71, 期号: 13, 页码: 9
作者:
Meng, Zhang
;
Peng Zhi-Min
;
Yang Qian-Suo
;
Ding Yan-Jun
;
Du Yan-Junl
收藏
  |  
浏览/下载:45/0
  |  
提交时间:2022/09/16
chemiluminescence
high-purity gas
trace gas
quenching
Degradation mechanisms of InGaN/GaN UVA LEDs under swift heavy ion irradiation: role of defects
期刊论文
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2021, 卷号: 36, 期号: 9, 页码: 7
作者:
Wang, Ying-Zhe
;
Zheng, Xue-Feng
;
Lv, Ling
;
Cao, Yan-Rong
;
Wang, Xiao-Hu
收藏
  |  
浏览/下载:19/0
  |  
提交时间:2021/12/08
UVA LED
swift heavy ion irradiation
degradation
defect
low frequency noise
VECSEL Thermal Focus Length Measurement and Angle Tuning Research
期刊论文
Zhongguo Jiguang/Chinese Journal of Lasers, 2021, 卷号: 48, 期号: 5
作者:
Y. Gao
;
J. Guo
;
W. Wang
;
C. Tong and X. Liang
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2022/06/13
Research on attitude measurement precision of star sensor influenced by space radiation damage
会议论文
Beijing, PEOPLES R CHINA, DEC 03-05, 2019
作者:
收藏
  |  
浏览/下载:8/0
  |  
提交时间:2021/08/25
CCD image sensor
CMOS image sensor
performance degradation
radiation damage
star sensor
Method and apparatus for determining acceptance/rejection of fine diameter wire bonding
专利
专利号: EP2549268B1, 申请日期: 2019-08-14, 公开日期: 2019-08-14
作者:
MATSUMOTO, JUN
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浏览/下载:40/0
  |  
提交时间:2019/12/23
Rapidly Measuring Charge Carrier Mobility of Organic Semiconductor Films Upon a Point-contact Four-Probes Method
期刊论文
IEEE Journal of the Electron Devices Society, 2019, 卷号: 7, 页码: 303-308
作者:
Li, Dongfan
;
Li, Shengtao
;
Lu, Wanlong
;
Feng, Shi
;
Wei, Peng
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  |  
浏览/下载:20/0
  |  
提交时间:2019/11/19
charge carrier mobility
Electric potential
Electrodes
Films
Logic gates
Organic semiconductor films
Organic semiconductors
point-contact four-probes method.
Probes
Semiconductor device measurement
In situ Condition Monitoring of IGBT Based on Miller Plateau Duration
期刊论文
IEEE Transactions on Power Electronics, 2019, 卷号: 34, 页码: 769-782
作者:
Liu, Jingcun
;
Zhang, Guogang
;
Chen, Qian
;
Qi, Lu
;
Geng, Yingsan
收藏
  |  
浏览/下载:20/0
  |  
提交时间:2019/11/19
Accelerated aging test
Closed-form expression
Gate oxide degradation
High electric field stress
Multiple failure mechanisms
On line measurement system
Online condition monitoring
Semiconductor device reliability
Vertical GaN-on-GaN PIN diodes fabricated on free-standing GaN wafer using an ammonothermal method
期刊论文
Journal of Alloys and Compounds, 2019, 卷号: 804, 页码: 435-440
作者:
S.W.H.Chen
;
H.Y.Wang
;
C.Hu
;
Y.Chen
;
H.Wang
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2020/08/24
Free standing gallium nitride (GaN),GaN-On-GaN,Power PIN diode,p-n diodes,Chemistry
Measuring Hanbury Brown and Twiss effect of multi-spatial-mode thermal light at ultrashort timescale by two-photon absorption
期刊论文
IEEE Photonics Journal, 2018, 卷号: 10
作者:
Tang, Zhiguo
;
Bai, Bin
;
Zhou, Yu
;
Zheng, Huaibin
;
Chen, Hui
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2019/11/19
Coherence
Detectors
Feynman&
#x0027
s pathintegral theory
Hanbury Brown and Twiss effect
Heterojunction bipolar transistors
Interference
Optical interferometry
Photonics
Semiconductor device measurement
two-photon-absorption detection
Experimental investigation of loss and gain characteristics of an abnormal InxGa1-xAs-GaAs quantum well structure
期刊论文
Chinese Optics Letters, 2018, 卷号: 16, 期号: 1, 页码: 5
作者:
Jia, Y.
;
Yu, Q. N.
;
Li, F.
;
Wang, M. Q.
;
Lu, W.
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  |  
浏览/下载:10/0
  |  
提交时间:2019/09/17
semiconductor-lasers
midinfrared laser
segregation
emission
Optics
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