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浏览/检索结果: 共6条，第1-6条 帮助 已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Self-selection RRAM Cell with Sub-mu A Switching Current and Robust Reliability Fabricated by High-K/Metal Gate CMOS Compatible Technology 其他 2016-01-01 Huang, Peng; Chen, Sijie; Zhao, Yudi; Chen, Bing; Gao, Bin; Liu, Lifeng; Liu, Xiaoyan; Kang, Jinfeng 收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03 Self-Selection RRAM Cell With Sub-mu A Switching Current and Robust Reliability Fabricated by High-K/Metal Gate CMOS Compatible Technology 期刊论文 IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016 Huang, Peng; Chen, Sijie; Zhao, Yudi; Chen, Bing; Gao, Bin; Liu, Lifeng; Chen, Yong; Zhang, Ziying; Bu, Weihai; Wu, Hanming; Liu, Xiaoyan; Kang, Jinfeng 收藏  |  浏览/下载：9/0  |  提交时间：2017/12/03 High-K/metal gate (HKMG)  nonliner  resistive random access memory (RRAM)  resistive switching  retention  ultralow switching current  OXIDE-BASED RRAM  DEVICE CHARACTERISTICS  CROSSBAR ARRAY  RESISTANCE  MODEL   Attainment of dual-band edge work function by using a single metal gate and single high-k dielectric via ion implantation for HP CMOS device 期刊论文 Solid-State Electronics, 2016 作者:  Xu GB(许高博);  Zhou HJ(周华杰);  Zhu HL(朱慧珑);  Liu JB(刘金彪);  Wang Y(王垚) 收藏  |  浏览/下载：26/0  |  提交时间：2017/05/09 Impact of Random Interface Traps and Random Dopants in High-k/Metal Gate Junctionless FETs 期刊论文 ieee 纳米技术汇刊, 2014 Wang, Yijiao; Huang, Peng; Wei, Kangliang; Zeng, Lang; Liu, Xiaoyan; Du, Gang; Zhang, Xing; Kang, Jinfeng 收藏  |  浏览/下载：3/0  |  提交时间：2015/11/10 High-k/metal gate (HKMG)  junctionless FET (JL-FET)  random dopant fluctuation (RDF)  random interface traps (RITs)  TCAD simulation  MOSFETS  FLUCTUATIONS  VARIABILITY  SIMULATION   Integration Issue of Tensile SiN Liner for Dual Stress Liner(DSL) in Gate-Last High-k/Metal Gate(HKMG) Process Flow 期刊论文 ECS Trans., 2013 作者:  Wang GL(王桂磊);  Yin HZ(尹海洲);  Qin ZL(秦长亮) 收藏  |  浏览/下载：11/0  |  提交时间：2014/10/30 Random Interface Trap Induced Fluctuation in 22nm High-k/Metal Gate Junctionless and Inversion-mode FinFETs 其他 2013-01-01 Wang, Yijiao; Wei, Kangliang; Liu, Xiaoyan; Du, Gang; Kang, Jinfeng 收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13