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Beam optics of upgraded high energy heavy ion microbeam in Lanzhou 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2019, 卷号: 461, 页码: 10-15
作者:  Ponomarov, Artem;  Du, Guanghua;  Guo, Jinlong;  Liu, Wenjing;  Wu, Ruqun
收藏  |  浏览/下载：38/0  |  提交时间：2022/01/19
Energy harvesting properties of the functionally graded flexoelectric microbeam energy harvesters 期刊论文
ENERGY, 2019, 卷号: 171, 页码: 721-730
作者:  Qi, Lu
收藏  |  浏览/下载：7/0  |  提交时间：2019/12/11
Application of SEU imaging for analysis of device architecture using a 25 MeV/u Kr-86 ion microbeam at HIRFL 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2017, 卷号: 404, 页码: 254-258
作者:  Wang, Bin;  Liu, Tianqi;  Liu, Jie;  Yang, Zhenlei;  Guo, Jinlong
收藏  |  浏览/下载：27/0  |  提交时间：2018/05/31
Development of single-event-effects analysis system at the IMP microbeam facility 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2017, 卷号: 404, 页码: 250-253
作者:  Du, Guanghua;  Bi, Jinshun;  Ma, Shuyi;  Liu, Xiaojun;  Sheng, Lina
收藏  |  浏览/下载：26/0  |  提交时间：2018/05/31
Application of SEU imaging for analysis of device architecture using a 25 MeV/u Kr-86 ion microbeam at HIRFL 会议论文
作者:  Su, Hong;  Liu, Tianqi;  Yang, Zhenlei;  Guo, Jinlong;  Du, Guanghua
收藏  |  浏览/下载：26/0  |  提交时间：2018/08/20
Development of single-event-effects analysis system at the IMP microbeam facility 会议论文
作者:  Guo, Jinlong;  Ma, Shuyi;  Liu, Xiaojun;  Sheng, Lina;  Li, Yaning
收藏  |  浏览/下载：20/0  |  提交时间：2018/08/20
Development of single-event-effects analysis system at the IMP microbeam facility 会议论文
作者:  Sheng, Lina;  Guo, Jinlong;  Du, Guanghua;  Bi, Jinshun;  Liu, Wenjing
收藏  |  浏览/下载：26/0  |  提交时间：2018/08/20
Application of seu imaging for analysis of device architecture using a 25 mev/u kr-86 ion microbeam at hirfl 期刊论文
Nuclear instruments & methods in physics research section b-beam interactions with materials and atoms, 2017, 卷号: 404, 页码: 254-258
作者:  Liu, Tianqi;  Yang, Zhenlei;  Guo, Jinlong;  Du, Guanghua;  Tong, Teng
收藏  |  浏览/下载：87/0  |  提交时间：2019/04/23
Application of SEU imaging for analysis of device architecture using a 25 MeV/u Kr-86 ion microbeam at HIRFL 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2017, 卷号: 404, 页码: 254-258
作者:  Tong T(童腾);  Liu, J;  Ye, B;  Wang, B;  Liu, JD
收藏  |  浏览/下载：26/0  |  提交时间：2019/08/27

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