Application of SEU imaging for analysis of device architecture using a 25 MeV/u Kr-86 ion microbeam at HIRFL

doi:10.1016/j.nimb.2017.01.069

	Application of SEU imaging for analysis of device architecture using a 25 MeV/u Kr-86 ion microbeam at HIRFL
	Su, Hong2 ; Liu, Tianqi 1,2,3; Yang, Zhenlei 5; Guo, Jinlong2 ; Du, Guanghua2 ; Tong, Teng 4; Wang, Xiaohui 2; Liu, Wenjing 2; Liu, Jiande 2; Wang, Bin 2
	2017-08
关键词	Heavy-ion microbeam High-energy Single event upset FPGA Imaging
卷号	404
DOI	10.1016/j.nimb.2017.01.069
页码	254-258
英文摘要	The heavy-ion imaging of single event upset (SEU) in a flash-based field programmable gate array (FPGA) device was carried out for the first time at Heavy Ion Research Facility in Lanzhou (HIRFL). The three shift register chains with separated input and output configurations in device under test (DUT) were used to identify the corresponding logical area rapidly once an upset occurred. The logic units in DUT were partly configured in order to distinguish the registers in SEU images. Based on the above settings, the partial architecture of shift register chains in DUT was imaged by employing the microbeam of Kr-86 ion with energy of 25 MeV/u in air. The results showed that the physical distribution of registers in DUT had a high consistency with its logical arrangement by comparing SEU image with logic configuration in scanned area. (C) 2017 Elsevier B.V. All rights reserved.
会议录	NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
会议录出版者	ELSEVIER SCIENCE BV
会议录出版地	PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
语种	英语
资助项目	Ministry of Science and Technology[2012YQ03014204]
WOS研究方向	Instruments & Instrumentation ; Nuclear Science & Technology ; Physics
WOS记录号	WOS:000404709900048
内容类型	会议论文
源URL	[http://119.78.100.186/handle/113462/57830]
专题	近代物理研究所_实验物理中心
通讯作者	Liu, Jie
作者单位	1.Univ Chinese Acad Sci, Beijing 100049, Peoples R China 2.Chinese Acad Sci, Inst Modern Phys, Nanchang Rd 509, Lanzhou 730000, Peoples R China 3.Lanzhou Univ, Sch Phys Sci & Technol, Lanzhou 730000, Peoples R China 4.Chinese Acad Sci, Inst High Energy Phys, Beijing 100049, Peoples R China 5.Chinese Acad Sci, Technol & Engn Ctr Space Utilizat, Beijing 100094, Peoples R China
推荐引用方式 GB/T 7714	Su, Hong,Liu, Tianqi,Yang, Zhenlei,et al. Application of SEU imaging for analysis of device architecture using a 25 MeV/u Kr-86 ion microbeam at HIRFL[C]. 见:.