×
验证码:
换一张
忘记密码?
记住我
CORC
首页
科研机构
检索
知识图谱
申请加入
托管服务
登录
注册
在结果中检索
科研机构
安徽大学 [11]
内容类型
期刊论文 [11]
发表日期
2017 [4]
2016 [1]
2014 [1]
2013 [2]
2012 [2]
2011 [1]
更多...
×
知识图谱
CORC
开始提交
已提交作品
待认领作品
已认领作品
未提交全文
收藏管理
QQ客服
官方微博
反馈留言
浏览/检索结果:
共11条,第1-10条
帮助
限定条件
专题:安徽大学
第一署名单位
第一作者单位
通讯作者单位
已选(
0
)
清除
条数/页:
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
排序方式:
请选择
作者升序
作者降序
题名升序
题名降序
发表日期升序
发表日期降序
提交时间升序
提交时间降序
Modulation of interfacial and electrical properties of HfGdO/GaAs gate stacks by ammonium sulfide passivation and rapid thermal annealing
期刊论文
Journal of Alloys and Compounds, 2017, 卷号: Vol.704, 页码: 322-328
作者:
Lv,J. G.
;
Li,W. D.
;
Zheng,C. Y.
;
Zhu,L.
;
Liang,S.
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2019/04/22
ATOMIC LAYER DEPOSITION
BAND ALIGNMENT
HFO2
GAAS
DIELECTRICS
FILMS
GD
Annealing temperature-dependent microstructure and optical and electrical properties of solution-derived Gd-doped ZrO2 high-k gate dielectrics
期刊论文
Journal of Sol-Gel Science and Technology, 2017, 卷号: Vol.83 No.3, 页码: 675-682
作者:
Liang, S.
;
Jiang, S. S.
;
Sun, Z. Q.
;
He, G.
;
Zhu, L.
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2019/04/22
ATOMIC LAYER DEPOSITION
OXIDE THIN-FILMS
INTERFACIAL PROPERTIES
PLASMA-OXIDATION
HFO2
TRANSISTORS
MODULATION
SILICON
TIO2
ALD
Interface chemistry and electronic structure of ALD-derived HfAlO/Ge gate stacks revealed by X-ray photoelectron spectroscopy
期刊论文
Journal of Alloys and Compounds, 2017, 卷号: Vol.716, 页码: 1-6
作者:
Liu,Yanmei
;
Sun,Zhaoqi
;
Jiang,Shanshan
;
Li,Jing
;
Liu,Mao
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2019/04/24
ATOMIC-LAYER-DEPOSITION
DIELECTRICS
AL2O3
HFO2
Passivation of Ge surface treated with trimethylaluminum and investigation of electrical properties of HfTiO/Ge gate stacks
期刊论文
JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY, JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY, 2017, 卷号: Vol.33 No.8, 页码: 901-906
作者:
Jiang,Shanshan
;
Zhu,Li
;
Gao,Juan
;
Xiao,Dongqi
;
Liang,Shuang
收藏
  |  
浏览/下载:8/0
  |  
提交时间:2019/04/24
ATOMIC-LAYER-DEPOSITION
THERMAL-STABILITY
BAND ALIGNMENT
MOS CAPACITORS
HFO2
DIELECTRICS
AL2O3
SUBSTRATE
QUALITY
CMOS
Microstructure, optical and electrical properties of solution-derived peroxo-zirconium oxide gate dielectrics for CMOS application
期刊论文
Ceramics International, 2016, 卷号: Vol.42 No.1Part A, 页码: 759-766
作者:
Sun,Zhaoqi
;
Lv,Jianguo
;
Liu,Mao
;
Xiao,Dongqi
;
Jin,Peng
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2019/04/22
ATOMIC LAYER DEPOSITION
OXYGEN PARTIAL-PRESSURE
ZRO2 THIN-FILMS
TEMPERATURE-DEPENDENCE
ROOM-TEMPERATURE
STACKS
SEMICONDUCTOR
ELLIPSOMETRY
TRANSISTORS
OXIDATION
Modulating the interface quality and electrical properties of HfTiO/InGaAs gate stack by atomic-layer-deposition-derived AlO passivation layer
期刊论文
ACS Applied Materials and Interfaces, 2014, 卷号: Vol.6 No.24, 页码: 22013-22025
作者:
Chen, H.
;
He, G.
;
Cui, J.
;
Chen, X.
;
Sun, Z.
收藏
  |  
浏览/下载:10/0
  |  
提交时间:2019/04/24
atomic-layer-deposition
electrical
properties
high-k
gate
dielectric
metal-oxide-semiconductor
surface
passivation
Interface engineering and chemistry of Hf-based high-k dielectrics on III–V substrates.
期刊论文
Surface Science Reports, 2013, 卷号: Vol.68 No.1, 页码: 68-107
作者:
Sun,Zhaoqi
;
He,Gang
;
Chen,Xiaoshuang
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2019/04/22
ATOMIC-LAYER-DEPOSITION
FIELD-EFFECT TRANSISTORS
OXIDE-SEMICONDUCTOR CAPACITORS
CHEMICAL-VAPOR-DEPOSITION
MOLECULAR-BEAM EPITAXY
RAY-PHOTOELECTRON-SPECTROSCOPY
PULSED-LASER-DEPOSITION
LIQUID-INJECTION MOCVD
MODE INGAAS MOSFET
SOL-GEL METHOD
CVD-derived Hf-based High-k Gate Dielectrics
期刊论文
Critical Reviews in Solid State and Materials Science, 2013, 卷号: Vol.38 No.4, 页码: 235-261
作者:
Liu,Yanmei
;
Sun,Zhaoqi
;
Zhang,Lide
;
He,Gang
;
Chen,Xiaoshuang
收藏
  |  
浏览/下载:5/0
  |  
提交时间:2019/04/22
CHEMICAL-VAPOR-DEPOSITION
ATOMIC LAYER DEPOSITION
LIQUID-INJECTION MOCVD
SILICATE THIN-FILMS
ELECTRON-BEAM EVAPORATION
CATHODIC ARC DEPOSITION
HAFNIUM DIOXIDE FILMS
THERMAL-STABILITY
ALKOXIDE PRECURSORS
MICROELECTRONIC APPLICATIONS
Metal-organic chemical vapor deposition of aluminium oxynitride from propylamine–dimethylaluminium hydride and oxygen: growth mode dependence and performance optimization
期刊论文
Journal of Materials Chemistry, 2012, 卷号: Vol.22 No.15, 页码: 7468-7477
作者:
Chen,XS
;
Shi,SW
;
Zhang,LD
;
Sun,ZQ
;
He,G
收藏
  |  
浏览/下载:14/0
  |  
提交时间:2019/04/22
ATOMIC LAYER DEPOSITION
AL2O3 THIN-FILMS
THERMAL-STABILITY
REACTION SIMULATION
GATE DIELECTRICS
OXIDE
OZONE
SPECTROSCOPY
PRECURSORS
MOCVD
Review and Perspective of Hf-based High-k Gate Dielectrics on Silicon
期刊论文
Critical Reviews in Solid State and Materials Science, 2012, 卷号: Vol.37 No.3, 页码: 131-157
作者:
Li,G
;
Zhang,LD
;
Sun,ZQ
;
He,G
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2019/04/22
CHEMICAL-VAPOR-DEPOSITION
FIELD-EFFECT TRANSISTORS
ATOMIC LAYER DEPOSITION
ELECTRON-BEAM EVAPORATION
CATHODIC ARC DEPOSITION
THIN-FILMS
THERMAL-STABILITY
HAFNIUM OXIDE
INTERFACIAL PROPERTIES
BAND ALIGNMENT
©版权所有 ©2017 CSpace - Powered by
CSpace