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Influence of Geometry of Microbump Interconnects on Thermal Stress and Fatigue Life of Interconnects in Copper Filled Through Silicon Via Str (CPCI-S收录) 会议论文
2013 14TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT)
作者:  Qin, Hong-Bo[1];  Yuwen, Hui-Hui[1];  Zhou, Min-Bo[1];  Zhang, Xin-Ping[1]
收藏  |  浏览/下载:2/0  |  提交时间:2019/04/15


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