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Breaking the Current-Retention Dilemma in Cation-Based Resistive Switching Devices Utilizing Graphene with Controlled Defects 期刊论文
Advanced Materials, 2018
作者:  Zhao XL(赵晓龙);  Liu Q(刘琦);  Liu S(刘森);  Niu JB(牛洁斌);  Zhang XM(张续猛)
收藏  |  浏览/下载:23/0  |  提交时间:2019/04/10
Improvement of Device Reliability by Introducing a BEOL-Compatible TiN Barrier Layer in CBRAM 期刊论文
IEEE ELECTRON DEVICE LETTERS, 2017
作者:  Cao RR(曹荣荣);  Liu M(刘明);  Long SB(龙世兵);  Lv HB(吕杭炳);  Wang Y(王艳)
收藏  |  浏览/下载:21/0  |  提交时间:2018/07/12
Emulating Short-Term and Long-Term Plasticity of Bio-Synapse Based on Cu,a-Si,Pt Memristor 期刊论文
IEEE ELECTRON DEVICE LETTERS, 2017
作者:  Wu FC(伍法才);  Zhang XM(张续猛);  Liu S(刘森);  Liu M(刘明);  Wu QT(吴全潭)
收藏  |  浏览/下载:25/0  |  提交时间:2018/07/12


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