CORC

浏览/检索结果: 共18条,第1-10条 帮助

限定条件                
已选(0)清除 条数/页:   排序方式:
Regulation of transcriptionally active genes via the catalytically inactive Cas9 in C. elegans and D. rerio 期刊论文
细胞研究英文版, 2015
Long Lijiang; Guo Hong; Yao Di; Xiong Kai; Li Yongjun; Liu Pengpeng; Zhu Zuoyan; Liu Dong
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/13
New insights into the design for end-of-life variability of NBTI in scaled high-��/metal-gate Technology for the nano-reliability era 其他
2015-01-01
Ren, Pengpeng; Wang, Runsheng; Ji, Zhigang; Hao, Peng; Jiang, Xiaobo; Guo, Shaofeng; Luo, Mulong; Duan, Meng; Zhang, Jian F.; Wang, Jianping; Liu, Jinhua; Bu, Weihai; Wu, Jingang; Wong, Waisum; Yu, Shaofeng; Wu, Hanming; Lee, Shiuh-Wuu; Xu, Nuo; Huang, Ru
收藏  |  浏览/下载:6/0  |  提交时间:2017/12/03
New understanding of state-loss in complex RTN: Statistical experimental study, trap interaction models, and impact on circuits 其他
2015-01-01
Zou, Jibin; Wang, Runsheng; Guo, Shaofeng; Luo, Mulong; Yu, Zhuoqing; Jiang, Xiaobo; Ren, Pengpeng; Wang, Jianping; Liu, Jinhua; Wu, Jingang; Wong, Waisum; Yu, Shaofeng; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan; Huang, Ru
收藏  |  浏览/下载:5/0  |  提交时间:2017/12/03
Understanding NBTI-induced dynamic variability in the nano-reliability Era: From devices to circuits 其他
2015-01-01
Wang, Runsheng; Ren, Pengpeng; Liu, Changze; Guo, Shaofeng; Huang, Ru
收藏  |  浏览/下载:2/0  |  提交时间:2017/12/03
Understanding NBTI-induced Dynamic Variability in the nano-Reliability Era: from Devices to Circuits 其他
2015-01-01
Wang, Runsheng; Ren, Pengpeng; Liu, Changze; Guo, Shaofeng; Huang, Ru
收藏  |  浏览/下载:2/0  |  提交时间:2017/12/03
Experimental study on the oxide trap coupling effect in metal oxide semiconductor field effect transistors with HfO2 gate dielectrics 期刊论文
应用物理学快报, 2014
Ren, Pengpeng; Wang, Runsheng; Jiang, Xiaobo; Qiu, Yingxin; Liu, Changze; Huang, Ru
收藏  |  浏览/下载:6/0  |  提交时间:2015/11/10
Heritable/conditional genome editing in C. elegans using a CRISPR-Cas9 feeding system 期刊论文
细胞研究英文版, 2014
Liu, Pengpeng; Long, Lijiang; Xiong, Kai; Yu, Bo; Chang, Nannan; Xiong, Jing-Wei; Zhu, Zuoyan; Liu, Dong
收藏  |  浏览/下载:1/0  |  提交时间:2015/11/11
Impacts of Cycle-to-Cycle Variation effects on the Prediction of NBTI Degradation and the Resulted Dynamic Variations in High-kappa MOSFETs 其他
2013-01-01
Ren, Pengpeng; Liu, Changze; Wang, Runsheng; Li, Meng; Wang, Yangyuan; Huang, Ru
收藏  |  浏览/下载:4/0  |  提交时间:2015/11/13
New Observations on Complex RTN in Scaled High-kappa/Metal-gate MOSFETs - the Role of Defect Coupling under DC/AC Condition 其他
2013-01-01
Ren, Pengpeng; Hao, Peng; Liu, Changze; Wang, Runsheng; Jiang, Xiaobo; Qin, Yingxin; Huang, Ru; Guo, Shaofeng; Luo, Mulong; Zou, Jibin; Li, Meng; Wang, Jianping; Wu, Jingang; Liu, Jinhua; Bu, Weihai; Wong, Waisum; Yu, Scott; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan
收藏  |  浏览/下载:3/0  |  提交时间:2015/11/13
Deep understanding of AC RTN in MuGFETs through new characterization method and impacts on logic circuits 其他
2013-01-01
Zou, Jibin; Wang, Runsheng; Luo, Mulong; Huang, Ru; Xu, Nuo; Ren, Pengpeng; Liu, Changze; Xiong, Weize; Wang, Jianping; Liu, Jinhua; Wu, Jingang; Wong, Waisum; Yu, Shaofeng; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan
收藏  |  浏览/下载:5/0  |  提交时间:2015/11/13


©版权所有 ©2017 CSpace - Powered by CSpace