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	Impacts of Cycle-to-Cycle Variation effects on the Prediction of NBTI Degradation and the Resulted Dynamic Variations in High-kappa MOSFETs
	Ren, Pengpeng ; Liu, Changze ; Wang, Runsheng ; Li, Meng ; Wang, Yangyuan ; Huang, Ru
	2013
英文摘要	In this paper, the impacts of cycle-to-cycle variation (CCV) effects on the predictions of NBTI degradation and the resulted dynamic variations are studied in highly-scaled high-kappa pFETs. By adopting the statistical trap-response (STR) technique, the 2-D distributions and the correlations of key parameters in compact NBTI models due to both device-to-device variation (DDV) and cycle-to-cycle variation (CCV) are extracted. Large error can be found if not considering the CCV effects in predicting the NBTI degradations and resulted time-dependent variations. Different compact NBTI models are also compared for accurate reliability-variability predictions in nanoscale device and circuit design.; http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000326324800026&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=8e1609b174ce4e31116a60747a720701 ; Engineering, Electrical & Electronic; CPCI-S(ISTP); 0
语种	英语
内容类型	其他
源URL	[http://ir.pku.edu.cn/handle/20.500.11897/292590]
专题	信息科学技术学院
推荐引用方式 GB/T 7714	Ren, Pengpeng,Liu, Changze,Wang, Runsheng,et al. Impacts of Cycle-to-Cycle Variation effects on the Prediction of NBTI Degradation and the Resulted Dynamic Variations in High-kappa MOSFETs. 2013-01-01.

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