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CORC

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The conduction mechanism of stress induced leakage current through ultra-thin gate oxide under constant voltage stresses 期刊论文
中国物理英文版, 2005
Wang, YG; Xu, MZ; Tan, CH; Zhang, JF; Duan, XR
收藏  |  浏览/下载：4/0  |  提交时间：2015/11/16
The statistical analysis of substrate current to soft breakdown in ultra-thin gate oxide n-MOSFETs 其他
2004-01-01
Wang, YG; Shi, K; Jia, GS; Xu, MZ; Tan, CH; Duan, XR
收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13
Weibull characteristics of n-MOSFET's with ultrathin gate oxides under FN stress and lifetime prediction 期刊论文
microelectronics reliability, 2002
Mu, FC; Xu, MZ; Tan, CH; Duan, XR
收藏  |  浏览/下载：2/0  |  提交时间：2015/11/10
A statistical equivalent relationship between TDDW and TDDB of ultra-thin oxides 期刊论文
chinese journal of electronics, 2002
Mu, FC; Xu, MZ; Tan, CH; Duan, XR
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/13
A new lifetime prediction method for hot-carrier degradation in n-MOSFETs with ultrathin gate oxides under V-g = V-d 其他
2001-01-01
Mu, FC; Xu, MZ; Tan, CH; Duan, XR
收藏  |  浏览/下载：5/0  |  提交时间：2015/11/10
Another way to investigate the characteristics of Time-Dependent Dielectric Breakdown of ultra-thin oxides 其他
2001-01-01
Mu, FC; Xu, MZ; Tan, CH; Duan, XR
收藏  |  浏览/下载：1/0  |  提交时间：2015/11/13
Current induced subthreshold trap generation, degradation, and breakdown in the thin oxide 其他
2001-01-01
Xu, MZ; Tan, CH; Chen, H; Duan, XR
收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13
Stress-induced high-field gate leakage current in ultra-thin gate oxide 期刊论文
固体电子学, 2000
Wei, JL; Mao, LF; Xu, MZ; Tan, CH; Duan, XR
收藏  |  浏览/下载：1/0  |  提交时间：2015/11/10
Synthesis of Y3Al5O12 : Eu3+ phosphor by sol-gel method and its luminescence behavior 其他
1998-01-01
Ruan, SK; Zhou, JG; Zhong, AM; Duan, JF; Yang, XB; Su, MZ
收藏  |  浏览/下载：5/0  |  提交时间：2015/11/11

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