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科研机构
西安交通大学 [23]
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期刊论文 [23]
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2019 [1]
2018 [4]
2017 [3]
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内容类型:期刊论文
专题:西安交通大学
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Impact of TID on latch up induced by pulsed irradiation in CMOS circuits
期刊论文
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 2019, 卷号: 440, 页码: 95-100
作者:
Li, Ruibin
;
He, Chaohui
;
Chen, Wei
;
Li, Junlin
;
Wang, Chenhui
收藏
  |  
浏览/下载:4/0
  |  
提交时间:2019/11/19
Base recombination currents
Dose rate
Latch-ups
Oxide trapped charge
Pulsed irradiation
Shallow trench isolation
Surface recombinations
Total Ionizing Dose
Preliminary single event effect distribution investigation on 28?nm SoC using heavy ion microbeam
期刊论文
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 2018
作者:
Yang, Weitao
;
Du, Xuecheng
;
Guo, Jinlong
;
Wei, Junze
;
Du, Guanghua
收藏
  |  
浏览/下载:26/0
  |  
提交时间:2019/11/19
All Programmable SoC
Heavy ion microbeam
Layout information
Modern physics
On chip memory
Partial cross section
Single event effects
System on chips (SoC)
A Fine-Grained Software-Implemented DMA Fault Tolerance for SoC Against Soft Error
期刊论文
Journal of Electronic Testing: Theory and Applications (JETTA), 2018, 卷号: 34, 页码: 717-733
作者:
Du, Xiaozhi
;
Luo, Dongyang
;
He, Chaohui
;
Liu, Shuhuan
收藏
  |  
浏览/下载:9/0
  |  
提交时间:2019/11/19
DMA
Fault injection
Fault tolerance
Soft error
System on Chip (SoC)
Effects of photonic crystal structures on the imaging properties of a ZnO:Ga image converter
期刊论文
Optics Letters, 2018, 卷号: 43, 页码: 5647-5650
作者:
Xu, Mengxuan
;
Chen, Liang
;
Liu, Bo
;
Zhu, Zhichao
;
Huang, Feng
收藏
  |  
浏览/下载:10/0
  |  
提交时间:2019/11/19
FFI4SoC: a Fine-Grained Fault Injection Framework for Assessing Reliability against Soft Error in SoC
期刊论文
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2018, 卷号: 34, 页码: 15-25
作者:
Du, Xiaozhi
;
Luo, Dongyang
;
Shi, Kailun
;
He, Chaohui
;
Liu, Shuhuan
收藏
  |  
浏览/下载:2/0
  |  
提交时间:2019/11/26
Fault injection
Reliability assessment
SEU
Systemon Chip (SoC)
Fault tolerance assessment
Measurement of single event effects induced by alpha particles in the Xilinx Zynq-7010 System-on-Chip
期刊论文
JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, 2017, 卷号: 54, 页码: 287-292
作者:
Du, Xuecheng
;
He, Chaohui
;
Liu, Shuhuan
;
Zhang, Yao
;
Li, Yonghong
收藏
  |  
浏览/下载:10/0
  |  
提交时间:2019/11/26
System-on-chip
alpha particle
single event effects
radiation effect
An Investigation of ELDRS in Different SiGe Processes
期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2017, 卷号: 64, 页码: 1137-1141
作者:
Li, Pei
;
He, Chaohui
;
Guo, Hongxia
;
Guo, Qi
;
Zhang, Jinxin
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2019/11/26
emitter-base (EB)-spacer geometry
enhanced low dose rate sensitivity (ELDRS)
isolation structure
Different silicon-germanium (SiGe) process
Single event effects sensitivity of low energy proton in Xilinx Zynq-7010 system-on chip
期刊论文
MICROELECTRONICS RELIABILITY, 2017, 卷号: 71, 页码: 65-70
作者:
Du, Xuecheng
;
Liu, Shuhuan
;
Luo, Dongyang
;
Zhang, Yao
;
Du, Xiaozhi
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2019/11/26
Proton irradiation
Single event effects
System on chip
Vacancy effects on the formation of He and Kr cavities in 3C-SiC irradiated and annealed at elevated temperatures
期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2016, 卷号: 389, 期号: [db:dc_citation_issue], 页码: 40-47
作者:
Zang, Hang
;
Jiang, Weilin
;
Liu, Wenbo
;
Devaraj, Arun
;
Edwards, Danny J.
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2019/12/02
Vacancy effect
High-temperature annealing
Ion irradiation
3C-SiC
He and Kr cavities
Irradiation Induced Microstructure Evolution in Nanostructured Materials: A Review
期刊论文
MATERIALS, 2016, 卷号: 9, 期号: [db:dc_citation_issue]
作者:
Liu, Wenbo
;
Ji, Yanzhou
;
Tan, Pengkang
;
Zang, Hang
;
He, Chaohui
收藏
  |  
浏览/下载:1/0
  |  
提交时间:2019/12/02
nanostructured materials
grain boundary
void denuded zones
irradiation resistance
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