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科研机构
华南理工大学 [12]
暨南大学 [2]
江苏大学 [1]
内容类型
会议论文 [15]
发表日期
2018 [1]
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The age variation of HER2 immunohistochemistry positive rate in gastric cancer
会议论文
MODERN PATHOLOGY, 2018-03-01
作者:
Xi, Yangfeng[1]
;
Xu, Chen[2]
;
Liu, Yiqiang[3]
;
Yan, Xiaochu[4]
;
Huang, Chuansheng[5]
收藏
  |  
浏览/下载:53/0
  |  
提交时间:2019/12/24
TimeStream: Reliable stream computation in the cloud (EI收录)
会议论文
Proceedings of the 8th ACM European Conference on Computer Systems, EuroSys 2013, Prague, Czech republic, April 15, 2013 - April 17, 2013
作者:
Qian, Zhengping[1]
;
He, Yong[1,2]
;
Su, Chunzhi[1,3]
;
Wu, Zhuojie[1,3]
;
Zhu, Hongyu[1,3]
收藏
  |  
浏览/下载:1/0
  |  
提交时间:2019/04/15
Batch data processing
Cluster computing
Computer programming
Distributed parameter control systems
Fault tolerance
A simple leakage current model for polycrystalline silicon nanowire thin-film transistors (EI收录)
会议论文
2013 IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2013, Hong Kong, Hong kong, June 3, 2013 - June 5, 2013
作者:
He, Hongyu[1,2]
;
He, Jin[1,2]
;
Deng, Wanling[1,2]
;
Wang, Hao[1,2]
;
Hu, Yue[1,2]
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2019/04/15
Electron devices
Electron emission
Nanowires
Polysilicon
Semiconducting organic compounds
Thin film transistors
Study and theoretical calculation on new type of adsorption chiller (EI收录)
会议论文
Applied Mechanics and Materials, Guangzhou, China, December 29, 2012 - December 30, 2012
作者:
He, Zhaohong[1]
;
Huang, Hongyu[1]
;
Yuan, Haoran[1]
;
Kobayashi, Noriyuki[2]
;
Chen, Yong[3]
收藏
  |  
浏览/下载:1/0
  |  
提交时间:2019/04/15
Condenser tubes
Cooling systems
Evaporators
Refrigeration
Vapors
A Simple Leakage Current Model for Polycrystalline Silicon Nanowire Thin-Film Transistors (CPCI-S收录)
会议论文
2013 IEEE INTERNATIONAL CONFERENCE OF ELECTRON DEVICES AND SOLID-STATE CIRCUITS (EDSSC)
作者:
He, Hongyu[1,2]
;
He, Jin[1,2]
;
Deng, Wanling[1,2]
;
Wang, Hao[1,2]
;
Hu, Yue[1,2]
收藏
  |  
浏览/下载:1/0
  |  
提交时间:2019/04/15
Thin-film transistor (TFT)
polycrystalline silicon (poly-Si)
nanowire
leakage current
thermal field emission
Study on adsorption desiccant based hybrid air conditioning system (EI收录)
会议论文
Advanced Materials Research, Hohhot, China, June 23, 2012 - June 24, 2012
作者:
He, Zhaohong[1]
;
Huang, Hongyu[1,2]
;
Lin, Zhixian[1]
;
Yuan, Haoran[1]
;
Kobayashi, Noriyuki[2]
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2019/04/15
Adsorption
Air conditioning
Energy utilization
Humidity control
Refrigeration
Temperature control
Waste heat
Model of self-heating effect for undoped polycrystalline silicon thin film transistors (EI收录)
会议论文
ICCRD2011 - 2011 3rd International Conference on Computer Research and Development, Shanghai, China, March 11, 2011 - March 15, 2011
作者:
Wu, Qiong[1]
;
Yao, Ruohe[1]
;
He, Hongyu[1]
收藏
  |  
浏览/下载:1/0
  |  
提交时间:2019/04/15
Drain current
Heating
Polysilicon
Thin film devices
Thin film transistors
Thin films
Transistors
Surface potential based model for amorphous IGZO thin film transistors (EI收录)
会议论文
ICCRD2011 - 2011 3rd International Conference on Computer Research and Development, Shanghai, China, March 11, 2011 - March 15, 2011
作者:
He, Hongyu[1,2]
;
Tang, Huiling[1]
;
Zheng, Xueren[2]
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2019/04/15
Gallium
Surface potential
Surface properties
Thin film devices
Thin film transistors
Thin films
Transistors
Zinc
Grain boundary barrier height and threshold voltage model of polycrystalline silicon thin film transistors (EI收录)
会议论文
IWJT-2010: Extended Abstracts - 2010 International Workshop on Junction Technology, Shanghai, China, May 10, 2010 - May 11, 2010
作者:
He, Hongyu[1,2]
;
Zheng, Xueren[1]
收藏
  |  
浏览/下载:7/0
  |  
提交时间:2019/04/16
Electric fields
Grain boundaries
Polysilicon
Semiconducting silicon compounds
Thin film transistors
Threshold voltage
Model of N-type polycrystalline silicon thin film transistors under DC bias stress (EI收录)
会议论文
Proceedings - 2010 11th International Conference on Electronic Packaging Technology and High Density Packaging, ICEPT-HDP 2010, Xi'an, China, August 16, 2010 - August 19, 2010
作者:
He, Hongyu[1,2]
;
Zheng, Xueren[2]
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2019/04/16
Dangling bonds
Degradation
Electronics packaging
Packaging
Polysilicon
Semiconducting silicon compounds
Thin film transistors
Thin films
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