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A novel analysis method to determine the surface recombination velocities on unequally passivated surfaces of a silicon wafer by the short wavelength spectrum excited quasi-steady-state photoconductance measurement 期刊论文
AIP ADVANCES, 2018, 卷号: 8
作者:  Wei, Yi;  Lin, Yiren;  Yang, Xichuan;  Tan, Xin;  Su, Jia
收藏  |  浏览/下载:14/0  |  提交时间:2019/12/02


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