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Application of SEU imaging for analysis of device architecture using a 25 MeV/u Kr-86 ion microbeam at HIRFL 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2017, 卷号: 404, 页码: 254-258
作者:  Wang, Bin;  Liu, Tianqi;  Liu, Jie;  Yang, Zhenlei;  Guo, Jinlong
收藏  |  浏览/下载:27/0  |  提交时间:2018/05/31
Application of SEU imaging for analysis of device architecture using a 25 MeV/u Kr-86 ion microbeam at HIRFL 会议论文
作者:  Su, Hong;  Liu, Tianqi;  Yang, Zhenlei;  Guo, Jinlong;  Du, Guanghua
收藏  |  浏览/下载:26/0  |  提交时间:2018/08/20


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