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A comparison of heavy ion induced single event upset susceptibility in unhardened 6T/SRAM and hardened ADE/SRAM 会议论文
作者:  Yan, Weiwei;  Wang, Bin;  Zeng, Chuanbin;  Geng, Chao;  Liu, Tianqi
收藏  |  浏览/下载:40/0  |  提交时间:2018/08/20
Low energy proton induced single event upset in 65 nm DDR and QDR commercial SRAMs 会议论文
作者:  Ye, B.;  Liu, J.;  Wang, T. S.;  Liu, T. Q.;  Maaz, K.
收藏  |  浏览/下载:19/0  |  提交时间:2018/08/20
Research on 220kV GIS Enclosure Circulation and Temporary Ground Potential Rise 会议论文
43rd Annual Conference of the IEEE-Industrial-Electronics-Society (IECON), OCT 29-NOV 01, 2017
作者:  Liu, Xinghua;  Lv, Xuebin;  Sun, Xuefeng;  Wang, Tao;  Wang, Shikun
收藏  |  浏览/下载:6/0  |  提交时间:2019/12/31
The Design of Automatic Silk Material Replacement Device on 3D Printers Based on FDM Technology 会议论文
3rd International Forum on Energy, Environment Science and Materials (IFEESM), Shenzhen, PEOPLES R CHINA, NOV 25-26, 2017
作者:  Wang, Jian-Bin*;  Yin, Ji-Shu;  Yu-Lin
收藏  |  浏览/下载:2/0  |  提交时间:2019/12/27


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