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A 0.13 mu m 64Mb HfOx ReRAM Using Configurable Ramped Voltage Write and Low Read-Disturb Sensing Techniques for Reliability Improvement 会议论文
作者:  Han, Xiaowei;  Jia, Qian;  Sun, Hongbin;  Wang, Longfei;  Wu, Huaqiang
收藏  |  浏览/下载:8/0  |  提交时间:2019/11/26
A 0.13μm 64Mb HfOxReRAM using configurable ramped voltage write and low read-disturb sensing techniques for reliability improvement 会议论文
作者:  Han, Xiaowei;  Jia, Qian;  Sun, Hongbin;  Wang, Longfei;  Wu, Huaqiang
收藏  |  浏览/下载:5/0  |  提交时间:2019/11/26


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