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浏览/检索结果: 共3条，第1-3条 帮助 限定条件 发表日期：2013    专题：北京大学    第一署名单位    第一作者单位    通讯作者单位     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Tuning the redox activity of encapsulated metal clusters via the metallic and semiconducting character of carbon nanotubes 期刊论文 proceedings of the national academy of sciences of the united states of america, 2013 Zhang, Fan; Pan, Xiulian; Hu, Yongfeng; Yu, Liang; Chen, Xiaoqi; Jiang, Peng; Zhang, Hongbo; Deng, Shibin; Zhang, Jin; Bolin, Trudy B.; Zhang, Shuo; Huang, Yuying; Bao, Xinhe 收藏  |  浏览/下载：3/0  |  提交时间：2015/11/16 confined catalysis  confinement effect  RAMAN-SPECTROSCOPY  CHARGE-TRANSFER  IN-SITU  OLEFIN METATHESIS  ATOMIC-SCALE  CATALYSIS  FUNCTIONALIZATION  CONFINEMENT  OXIDATION  DIAMETER   Investigations on Line-Edge Roughness (LER) and Line-Width Roughness (LWR) in Nanoscale CMOS Technology: Part II-Experimental Results and Impacts on Device Variability 期刊论文 ieee电子器件汇刊, 2013 Wang, Runsheng; Jiang, Xiaobo; Yu, Tao; Fan, Jiewen; Chen, Jiang; Pan, David Z.; Huang, Ru 收藏  |  浏览/下载：7/0  |  提交时间：2015/11/10 FinFET  line-edge roughness (LER)  line-width roughness (LWR)  nanowire  variability  INTRINSIC PARAMETER FLUCTUATIONS  FINFET MATCHING PERFORMANCE  MOSFETS  DECANANOMETER  NANOWIRES  OXIDATION  NOISE   Hopping Effect of Hydrogen-Doped Silicon Oxide Insert RRAM by Supercritical CO2 Fluid Treatment 期刊论文 ieee electron device letters, 2013 Chang, Kuan-Chang; Pan, Chih-Hung; Chang, Ting-Chang; Tsai, Tsung-Ming; Zhang, Rui; Lou, Jen-Chung; Young, Tai-Fa; Chen, Jung-Hui; Shih, Chih-Cheng; Chu, Tian-Jian; Chen, Jian-Yu; Su, Yu-Ting; Jiang, Jhao-Ping; Chen, Kai-Huang; Huang, Hui-Chun; Syu, Yong-En; Gan, Der-Shin; Sze, Simon M. 收藏  |  浏览/下载：3/0  |  提交时间：2015/11/11 Hopping conduction  resistive random access memory (RRAM)  supercritical fluid  RERAM