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Heavy-Ion-Induced Permanent Damage in Ultra-deep Submicron Fully Depleted SOI Devices 其他
2012-01-01
Tan, Fei; An, Xia; Huang, Liangxi; Zhang, Xing; Huang, Ru
收藏  |  浏览/下载:4/0  |  提交时间:2015/11/13
Investigation on Channel Hot Carrier Degradation of Ultra Deep Submicron SOI pMOSFETs 其他
2012-01-01
Huang, Liang-Xi; An, Xia; Tan, Fei; Wu, Wei-Kang; Huang, Ru
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/13
Effect of Heavy Ion Irradiation on the RF Performance of 0.18 mu m Bulk Si MOSFETs 其他
2012-01-01
Tan, Fei; Yang, Dong; An, Xia; Ye, Le; You, Li; Zhang, Xing; Huang, Ru
收藏  |  浏览/下载:3/0  |  提交时间:2015/11/13


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