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浏览/检索结果: 共9条，第1-9条 帮助 限定条件 专题：西安交通大学    第一署名单位    第一作者单位    通讯作者单位     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Characterization of 1.2 kV 4H-SiC power MOSFETs and Si IGBTs at cryogenic and high temperatures 会议论文 作者:  Tian, Kai;  Qi, Jinwei;  Mao, Zhangsong;  Yang, Song;  Song, Wenjie 收藏  |  浏览/下载：6/0  |  提交时间：2019/11/19 Cryogenic temperatures  High temperature  Interface traps  Switching characteristics  Switching performance  Transfer characteristics  Trench mosfets  Wide temperature ranges   Correlation Between Dielectric Breakdown and Interface Traps Characteristics 期刊论文 Gaodianya Jishu/High Voltage Engineering, 2018, 卷号: 44, 页码: 432-439 作者:  Xie, Dongri;  Min, Daomin;  Liu, Wenfeng;  Li, Shengtao;  Kang, Wenbin 收藏  |  浏览/下载：12/0  |  提交时间：2019/11/26 Breakdown  Carrier multiplication  Collision ionization  High field strengths  Polypropylene nanocomposites  Power capacitor  Thermally stimulated depolarization currents  Traps   Threshold voltage model of total ionizing irradiated short-channel FD-SOI MOSFETs with Gaussian doping profile 期刊论文 IEEE Transactions on Nuclear Science, 2018, 卷号: 65, 页码: 2679-2690 作者:  Huang, Huixiang;  Wei, Sufen;  Pan, Jinyan;  Xu, Wenbin;  Chen, Chi-Cheng 收藏  |  浏览/下载：6/0  |  提交时间：2019/11/26 Gaussians  Integrated circuit modeling  Interface traps  MOS-FET  Short-channel effect  Silicon on insulator (SOI)  Threshold voltage modeling  Total dose radiation   Study of Interface Traps in AlGaN/GaN MISHEMTs Using LPCVD SiNx as Gate Dielectric 期刊论文 IEEE TRANSACTIONS ON ELECTRON DEVICES, 2017, 卷号: 64, 页码: 824-831 作者:  Lu, Xing;  Yu, Kun;  Jiang, Huaxing;  Zhang, Anping;  Lau, Kei May 收藏  |  浏览/下载：6/0  |  提交时间：2019/11/26 low pressure chemical vapor deposition (LPCVD) SiNx  interface traps  current collapse  passivation  AlGaN/GaN MIS high electron mobility transistors (MISHEMTs)   Total Dose Effects and Bias Instabilities of (NH4)(2)S Passivated Ge MOS Capacitors With HfxZr1-xOy Thin Films 期刊论文 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2017, 卷号: 64, 页码: 2913-2921 作者:  Mu, Yifei;  Fang, Yuxiao;  Zhao, Ce Zhou;  Zhao, Chun;  Lu, Qifeng 收藏  |  浏览/下载：3/0  |  提交时间：2019/11/26 germanium  HfxZr1-xOy  interface traps  total dose effect  oxide trapped charges   Interface Charges between Insulating Materials 期刊论文 IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 2017, 卷号: 24, 页码: 2633-2642 作者:  Wu, Kai;  Cheng, Chuanhui 收藏  |  浏览/下载：5/0  |  提交时间：2019/11/26 interface traps  multi-layer dielectrics  interfaces  Space charges  MWS polarization  interface potential barrier   Investigation of the interface traps and current collapse in LPCVD SiNx/AlGaN/GaN MISHEMTs 会议论文 作者:  Yu, Kun;  Liu, Chao;  Jiang, Huaxing;  Lu, Xing;  Lau, Kei May 收藏  |  浏览/下载：7/0  |  提交时间：2019/11/26 AlGaN/GaN MIS-HEMTs  Current collapse  I-V measurements  Interface traps  LPCVD SiNx  Metal insulator semiconductor high electron mobility transistors (MISHEMT)  Passivation layer  Plasma enhanced chemical vapor depositions (PE CVD)   Pulsed Vacuum Surface Flashover Characteristics of TiO2/Epoxy Nano-Micro Composites 期刊论文 IEEE TRANSACTIONS ON PLASMA SCIENCE, 2012, 卷号: 40, 期号: [db:dc_citation_issue], 页码: 68-77 作者:  Cheng, Yong-Hong;  Wang, Zeng-Bin;  Wu, Kai 收藏  |  浏览/下载：2/0  |  提交时间：2019/12/10 thermally stimulated depolarization current (TSDC)  traps  TiO2  flashover characteristic  Epoxy composite  interface  permittivity   DLTS investigation of interface traps in low temperature RF oxygen plasma grown SiO2/Si structure 期刊论文 Hsi-An Chiao Tung Ta Hsueh/Journal of Xi'an Jiaotong University, 1993, 卷号: 27, 期号: 5, 页码: 9-16 作者:  Liang, Zhenxian;  Han, Zhengsheng;  Wang, Lizhun;  Luo, Jinsheng 收藏  |  浏览/下载：2/0  |  提交时间：2020/01/07