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High Performance Metal-Gate/High-kappa GaN MOSFET With Good Reliability for Both Logic and Power Applications 期刊论文
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, 2016
Yi, Shih-Han; Ruan, Dun-Bao; Di, Shaoyan; Liu, Xiaoyan; Wu, Yung Hsien; Chin, Albert
收藏  |  浏览/下载：8/0  |  提交时间：2017/12/04
Study of impact of LATID on HCI reliability for LDMOS devices 其他
2016-01-01
Chandrashekhar; Sheu, Gene; Yang, Shao Ming; Chien, Ting Yao; Lin, Yun Jung; Wu, Chieh Chih; Lee, Tzu Chieh
收藏  |  浏览/下载：6/0  |  提交时间：2017/12/03
An efficient test structure for interface trap characterization under BTI stresses 其他
2014-01-01
He, Yandong; Zhang, Ganggang; Han, Lin; Zhang, Xing
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/13
Substrate Engineering by Hexagonal Boron Nitride/SiO2 for Hysteresis-Free Graphene FETs and Large-Scale Graphene p-n Junctions 期刊论文
chemistry an asian journal, 2013
Xu, Hua; Wu, Juanxia; Chen, Yabin; Zhang, Haoli; Zhang, Jin
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/10
A Test Structure and Spectroscopic Method for Monitoring Interface Traps 其他
2013-01-01
Wei, Chao; He, Yandong; Du, Gang; Zhang, Ganggang; Zhang, Xing
收藏  |  浏览/下载：1/0  |  提交时间：2015/11/13
Multiregion DCIV: A Sensitive Tool for Characterizing the Si/SiO2 Interfaces in LDMOSFETs 期刊论文
ieee electron device letters, 2012
He, Yandong; Zhang, Ganggang; Han, Lin; Zhang, Xing
收藏  |  浏览/下载：2/0  |  提交时间：2015/11/10
Thermal contact resistance across nanoscale silicon dioxide and silicon interface 期刊论文
应用物理杂志, 2012
Chen, Jie; Zhang, Gang; Li, Baowen
收藏  |  浏览/下载：2/0  |  提交时间：2015/11/12
Unified Reaction-Diffusion Model for Accurate Prediction of Negative Bias Temperature Instability Effect 期刊论文
日本应用物理学杂志, 2012
Ma, Chenyue; Mattausch, Hans Juergen; Miyake, Masataka; Matsuzawa, Kazuya; Iizuka, Takahiro; Yamaguchi, Seiichiro; Hoshida, Teruhiko; Kinoshita, Akinari; Arakawa, Takahiko; He, Jin; Miura-Mattausch, Mitiko
收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13
Three-dimensional Monte Carlo simulation of bulk fin field effect transistor 期刊论文
chinese physics b, 2012
Wang Jun-Cheng; Du Gang; Wei Kang-Liang; Zhang Xing; Liu Xiao-Yan
收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13
Normalized differential conductance spectroscopy to study the tunneling properties of post soft breakdown SiO2 其他
2010-01-01
Xu, Mingzhen; Tan, Changhua
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/13

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