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浏览/检索结果: 共10条，第1-10条 帮助 限定条件 专题：清华大学    第一署名单位    第一作者单位    通讯作者单位     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 用电子散斑法对纯镍薄片弯曲变形的测量 期刊论文 2010, 2010 郭香华; 方岱宁; 李喜德; GUO Xianghua; FANG Daining; LI Xide 收藏  |  浏览/下载：3/0 Strain and mechanical behavior measurements of soft tissues with digital speckle method 期刊论文 2010, 2010 Zhang, J; Jin, GC; Meng, LB; Jian, LH; Wang, AY; Lu, SB 收藏  |  浏览/下载：3/0 Full field and microregion deformation measurement of thin films using electronic speckle pattern interferometry and array microindentation marker method 期刊论文 2010, 2010 Xide Li; Cheng Wei; Yan Yang 收藏  |  浏览/下载：4/0 Improvement of measurement error for modified coherent gradient sensing 期刊论文 2010, 2010 Yao, XF; Xu, W; Yeh, HY 收藏  |  浏览/下载：4/0 Experimental investigation of polycrystalline material deformation based on a grain scale 期刊论文 2010, 2010, OCT Li, XD; Yang, Y; Wei, C 收藏  |  浏览/下载：2/0  |  提交时间：2017/06/15 SPECKLE PATTERN INTERFEROMETRY  MICRO-RAMAN SPECTROSCOPY  MULTICRYSTAL  Physics, Multidisciplinary   Calibration of displacement sensors with high-precision and large measurement range using temporal speckle pattern interferometry 期刊论文 2010, 2010 Xide Li; Yan Yang 收藏  |  浏览/下载：2/0 Investigation of capillary adhesion between the microcantilever and the substrate with electronic speckle pattern interferometry 期刊论文 2010, 2010 Li, Xide; Peng, Yun 收藏  |  浏览/下载：1/0 Real-time and full-field deflection measurement of thin films electroplated on the single crystal silicon wafers 期刊论文 2010, 2010 Xide Li; Cheng Wei 收藏  |  浏览/下载：3/0 An optical probe stage and its applications in mechanical behavior measurements of micro-objects and thin films 期刊论文 2010, 2010 Li, Xide; Yang, Yan 收藏  |  浏览/下载：2/0 In situ and real-time tensile testing of thin films using double-field-of-view electronic speckle pattern interferometry 期刊论文 2010, 2010 Xide Li; Yan Yang; Cheng Wei 收藏  |  浏览/下载：3/0