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Long-term variations of X-ray pulse profiles for the Crab pulsar: data analysis and modeling 期刊论文
SCIENCE CHINA-PHYSICS MECHANICS & ASTRONOMY, 2020, 卷号: 63, 期号: 10, 页码: 109511
作者:  Shang, LunHua;  Du, YuanJie;  Cui, XiangQun;  Dang, ShiJun;  Lu, JiGuang
收藏  |  浏览/下载：52/0  |  提交时间：2020/06/28
Moderate point: Balanced entropy and enthalpy contributions in soft matter 期刊论文
CHINESE PHYSICS B, 2017, 卷号: 26, 期号: 3, 页码: 30506
作者:  Wang, YT (reprint author), Chinese Acad Sci, Inst Theoret Phys, CAS Key Lab Theoret Phys, Beijing 100190, Peoples R China.;  He, BJ;  Wang, YT
收藏  |  浏览/下载：24/0  |  提交时间：2018/01/29
Moderate point: Balanced entropy and enthalpy contributions in soft matter 期刊论文
CHINESE PHYSICS B, 2017, 卷号: 26, 期号: 3, 页码: 30506
作者:  He, BJ;  Wang, YT;  Wang, YT (reprint author), Chinese Acad Sci, Inst Theoret Phys, CAS Key Lab Theoret Phys, Beijing 100190, Peoples R China.;  Wang, YT (reprint author), Univ Chinese Acad Sci, Sch Phys Sci, Beijing 100049, Peoples R China.
收藏  |  浏览/下载：11/0  |  提交时间：2017/12/21
Representation of fluctuation features in pathological knee joint vibroarthrographic signals using kernel density modeling method 期刊论文
http://dx.doi.org/10.1016/j.medengphy.2014.07.008, 2014
Yang, Shanshan; Cai, Suxian; Zheng, Fang; Wu, Yunfeng; Liu, Kaizhi; Wu, Meihong; Zou, Quan; Chen, Jian; 吴云峰; 吴梅红; 邹权
收藏  |  浏览/下载：4/0  |  提交时间：2015/07/22
Investigations on Line-Edge Roughness (LER) and Line-Width Roughness (LWR) in Nanoscale CMOS Technology: Part I-Modeling and Simulation Method 期刊论文
ieee电子器件汇刊, 2013
Jiang, Xiaobo; Wang, Runsheng; Yu, Tao; Chen, Jiang; Huang, Ru
收藏  |  浏览/下载：11/0  |  提交时间：2015/11/10
Investigations on Line-Edge Roughness (LER) and Line-Width Roughness (LWR) in Nanoscale CMOS Technology: Part II-Experimental Results and Impacts on Device Variability 期刊论文
ieee电子器件汇刊, 2013
Wang, Runsheng; Jiang, Xiaobo; Yu, Tao; Fan, Jiewen; Chen, Jiang; Pan, David Z.; Huang, Ru
收藏  |  浏览/下载：7/0  |  提交时间：2015/11/10
Back-Gate Bias Dependence of the Statistical Variability of FDSOI MOSFETs With Thin BOX 期刊论文
ieee电子器件汇刊, 2013
Yang, Yunxiang; Markov, Stanislav; Cheng, Binjie; Zain, Anis Suhaila Mohd; Liu, Xiaoyan; Asenov, Asen
收藏  |  浏览/下载：4/0  |  提交时间：2015/11/13
Investigation on Variability in Metal-Gate Si Nanowire MOSFETs: Analysis of Variation Sources and Experimental Characterization 期刊论文
ieee电子器件汇刊, 2011
Wang, Runsheng; Jing Zhuge; Huang, Ru; Yu, Tao; Zou, Jibin; Kim, Dong-Won; Park, Donggun; Wang, Yangyuan
收藏  |  浏览/下载：4/0  |  提交时间：2015/11/10
Variability Induced by Line Edge Roughness in Double-Gate Dopant-Segregated Schottky MOSFETs 期刊论文
ieee 纳米技术汇刊, 2011
Yang, Yunxiang; Yu, Shimeng; Zeng, Lang; Du, Gang; Kang, Jinfeng; Zhao, Yuning; Han, Ruqi; Liu, Xiaoyan
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/10
Simulation study of intrinsic parameter fluctuations in variable-body-factor silicon-on-thin-box metal oxide semiconductor field effect transistors 期刊论文
Japanese Journal of Applied Physics, 2011
Yang, Yunxiang; Du, Gang; Han, Ruqi; Liu, Xiaoyan
收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03

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