CORC

在结果中检索

CORC

浏览/检索结果: 共24条，第1-10条 帮助

限定条件    
已选(0)清除 条数/页：   排序方式：
Reliability variability simulation methodology for IC design: An EDA perspective 其他
2016-01-01
Zhang, Aixi; Huang, Chunyi; Guo, Tianlei; Chen, Alvin; Guo, Shaofeng; Wang, Runsheng; Huang, Ru; Xie, Jushan
收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03
Bias-dependent High Frequency Characterization of Through-Silicon Via (TSV) for 3D Integration 其他
2016-01-01
Sun, Xin; Fang, Runiu; Liu, Huan; Miao, Min; Jin, Yufeng
收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03
A-Si:H TFT gate driver with shared dual pull-down units for large-sized TFT-LCD applications 其他
2014-01-01
Hu, Zhijin; Liao, Congwei; Li, Junmei; Li, Wenjie; Zhang, Shengdong; Zeng, Limei; Lee, Chang-Yeh; Lai, Tzu-Chieh; Lo, Chang-Cheng; Lien, A.
收藏  |  浏览/下载：4/0  |  提交时间：2015/11/13
New Observations on Complex RTN in Scaled High-kappa/Metal-gate MOSFETs - the Role of Defect Coupling under DC/AC Condition 其他
2013-01-01
Ren, Pengpeng; Hao, Peng; Liu, Changze; Wang, Runsheng; Jiang, Xiaobo; Qin, Yingxin; Huang, Ru; Guo, Shaofeng; Luo, Mulong; Zou, Jibin; Li, Meng; Wang, Jianping; Wu, Jingang; Liu, Jinhua; Bu, Weihai; Wong, Waisum; Yu, Scott; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/13
Deep understanding of AC RTN in MuGFETs through new characterization method and impacts on logic circuits 其他
2013-01-01
Zou, Jibin; Wang, Runsheng; Luo, Mulong; Huang, Ru; Xu, Nuo; Ren, Pengpeng; Liu, Changze; Xiong, Weize; Wang, Jianping; Liu, Jinhua; Wu, Jingang; Wong, Waisum; Yu, Shaofeng; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan
收藏  |  浏览/下载：5/0  |  提交时间：2015/11/13
New observations on complex RTN in scaled high-��/metal-gate MOSFETs - The role of defect coupling under DC/AC condition 其他
2013-01-01
Ren, Pengpeng; Hao, Peng; Liu, Changze; Wang, Runsheng; Jiang, Xiaobo; Qiu, Yingxin; Huang, Ru; Guo, Shaofeng; Luo, Mulong; Zou, Jibin; Li, Meng; Wang, Jianping; Wu, Jingang; Liu, Jinhua; Bu, Weihai; Wong, Waisum; Yu, Scott; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan
收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13
Simulation Study of Intrinsic Parameter Fluctuations in Variable-Body-Factor Silicon-on-Thin-Box Metal Oxide Semiconductor Field Effect Transistors 其他
2011-01-01
Yang, Yunxiang; Du, Gang; Han, Ruqi; Liu, Xiaoyan
收藏  |  浏览/下载：3/0  |  提交时间：2015/11/13
Si3N4/SiO2 dielectric stacks for high reliable capacitive RF MEMS switch 其他
2011-01-01
Li, Gang; Hanke, Ulrik; Cheng, Zaijun; Min, Deokki; San, Haisheng; Chen, Xuyuan; 伞海生; 陈旭远
收藏  |  浏览/下载：3/0  |  提交时间：2015/07/22
An analytical model for negative bias temperature instability 其他
2010-01-01
Wang, Shengcheng; Du, Gang; Liu, Xiaoyan
收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13
Characteristics of Gate Current Random Telegraph Signal Noise in SiON/HfO2/TaN p-Type Metal-Oxide-Semiconductor Field-Effect Transistors under Negative Bias Temperature Instability Stress Condition 其他
2010-01-01
Zhang, Liangliang; Liu, Changze; Wang, Runsheng; Huang, Ru; Yu, Tao; Zhuge, Jing; Kirsch, Paul; Tseng, Hsing-Huang; Wang, Yangyuan
收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13

©版权所有 ©2017 CSpace - Powered by CSpace