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近代物理研究所 [5]
半导体研究所 [4]
清华大学 [1]
长春光学精密机械与物... [1]
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会议论文 [13]
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A two-step synthesis of NaTaO
3
microspheres for photocatalytic water splitting
会议论文
Li, Yingxuan (1)
;
Gou, Huange (2)
;
Lu, Jianjiang (2)
;
Wang, Chuanyi (1)
收藏
  |  
浏览/下载:14/0
  |  
提交时间:2014/11/10
NaTaO3
Microspheres
Photocatalytic water splitting
Rough surface
ECRIS DEVELOPMENT AT KVI*
会议论文
Lanzhou, 2010-09-06
V. Mironov
;
J.P.M. Beijers
;
S. Brandenburg
;
H.R. Kremers
;
J. Mulder
;
S. Saminathan
;
S. Brandenburg
收藏
  |  
浏览/下载:9/0
  |  
提交时间:2011/07/12
700 Μa
O6++
Agor Cyclotron
Pilot study of photochemical reaction under high PMContaminated condition by Tsinghua smog chamber
会议论文
Progress of Green Oxidation/Reduction Technologies, 2nd Asia-Pacific International Symposium on Air and Water Treatments by Green Oxidation/Reduction Technologies-Catalyst Plasma and Hybrid Systems, Dalian, PEOPLES R CHINA, Web of Science
Wu Shan
;
Hao Jiming
;
Lu Zifeng
;
Zhao Zhe
;
Li Junhua
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  |  
浏览/下载:2/0
Assessment of surface roughness by use of soft x-ray scattering (EI CONFERENCE)
会议论文
Soft X-Ray Lasers and Applications VIII, August 4, 2009 - August 6, 2009, San Diego, CA, United states
Yan-li M.
;
Yong-gang W.
;
Shu-yan C.
;
Bo C.
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  |  
浏览/下载:16/0
  |  
提交时间:2013/03/25
A soft x-ray reflectometer with laser produced plasma source has been designed
which can work from wavelength 8nm to 30 nm and has high performance. Using the soft x-ray reflectometer above
the scattering light distribution of silicon and zerodur mirrors which have super-smooth surfaces could be measured at different incidence angle and different wavelength. The measurement when the incidence angle is 2 degree and the wavelength is 1 lnm has been given in this paper. A surface scattering theory of soft x-ray grazing incidence optics based on linear system theory and an inverse scattering mathematical model is introduced. The vector scattering theory of soft x-ray scattering also is stated in detail. The scattering data are analyzed by both the methods above respectively to give information about the surface profiles. On the other hand
both the two samples are measured by WYKO surface profiler
and the surface roughness of the silicon and zerodur mirror is 1.3 nm and 1.5nm respectively. The calculated results are in quantitative agreement with those measured by WYKO surface profiler
which indicates that soft x-ray scattering is a very useful tool for the evaluation of highly polished surfaces. But there still some difference among the results of different theory and WYKO
and the possible reasons of such difference have been discussed in detail. 2009 SPIE.
Extreme ultraviolet narrow band emission from electron cyclotron resonance plasmas
会议论文
作者:
Zhao, H. Y.
;
Zhao, H. W.
;
Sun, L. T.
;
Zhang, X. Z.
;
Wang, H.
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  |  
浏览/下载:12/0
  |  
提交时间:2018/08/20
Extreme ultraviolet narrow band emission from electron cyclotron resonance plasmas
会议论文
作者:
Zhao, H. Y.
;
Zhao, H. W.
;
Sun, L. T.
;
Zhang, X. Z.
;
Wang, H.
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  |  
浏览/下载:10/0
  |  
提交时间:2018/08/20
OPALS: THE OXFORD PLASMA ACCELERATOR LIGHT SOURCE PROJECT
会议论文
Proceedings of FEL08, Gyeongju, Korea, Korea, 2008
作者:
R.Bartolini
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  |  
浏览/下载:6/0
  |  
提交时间:2017/02/15
Production of EUV power with SECRAL
会议论文
作者:
Zhao, Huan-Yu
;
Zhao, Hong-Wei
;
Sun, Liang-Ting
;
Zhang, Xue-Zhen
;
Sheng, Liu-Si
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  |  
浏览/下载:8/0
  |  
提交时间:2018/08/20
EUV light source
ECR plasma
EUV power
Production of EUV power with SECRAL
会议论文
作者:
Zhao, Huan-Yu
;
Zhao, Hong-Wei
;
Sun, Liang-Ting
;
Zhang, Xue-Zhen
;
Sheng, Liu-Si
收藏
  |  
浏览/下载:17/0
  |  
提交时间:2018/08/20
EUV light source
ECR plasma
EUV power
Epitaxial growth of SiC on complex substrates
会议论文
11th international conference on molecular beam epitaxy (mbe-xi), beijing, peoples r china, sep 11-15, 2000
Sun GS
;
Li JM
;
Luo MC
;
Zhu SR
;
Wang L
;
Zhang FF
;
Lin LY
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  |  
浏览/下载:16/0
  |  
提交时间:2010/11/15
optical microscopy
X-ray diffraction
molecular beam epitaxy
semiconducting silicon compounds
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