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Stress distribution in ultra thin SiO2 film/Si substrate system measured by a low level birefringence detection technique (EI收录) 会议论文
Materials Research Society Symposium Proceedings, San Francisco, CA, United states, April 13, 2004 - April 16, 2004
作者:  Liu, X.H.[1];  Peng, H.J.[1];  Wong, S.P.[1];  Zhao, Shounan[2]
收藏  |  浏览/下载:1/0  |  提交时间:2019/04/18
Fabrication and electrical characteristics of metal-ferroelectric Ba(Zr0.1Ti0.9)O3 film-insulator-silicon structure (CPCI-S收录EI收录) 会议论文
Integrated Ferroelectrics, Fuzhou, China, December 15, 2012 - December 20, 2012
作者:  Chen, Kai-Huang[1];  Cheng, Chien-Min[2];  Lin, Chun-Cheng[3];  Tsai, Jen-Hwan[3]
收藏  |  浏览/下载:2/0  |  提交时间:2019/04/15
The ferroelectric characteristics of Ba(Zr0.1Ti 0.9)O3 thin films under post-annealing treatment for applications in nonvolatile memory devic (EI收录) 会议论文
Advanced Materials Research, Changsha, China, May 28, 2011 - May 30, 2011
作者:  Chen, Kai Huang[1];  Tsai, Jen Hwan[2];  Wu, Chia Lin[3];  Lin, Jian Yang[3];  Cheng, Chien Min[4]
收藏  |  浏览/下载:8/0  |  提交时间:2019/04/15
High-reflectance of hybrid reflector with distributed bragg reflector and metal mirror for flip-chip ultra-violet light-emitting diodes (EI收录) 会议论文
Proceedings of SPIE - The International Society for Optical Engineering, Beijing, China, May 13, 2014 - May 15, 2014
作者:  Yang, Guang[1];  Huang, Huamao[1];  Wang, Hong[1]
收藏  |  浏览/下载:2/0  |  提交时间:2019/04/12


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