CORC

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Morphological defects and uniformity issues of 4H-SiC homoepitaxial layers grown on off-oriented (0001)Si faces 期刊论文
materials science in semiconductor processing, 2006, 卷号: 9, 期号: 1-3, 页码: 275-278
Sun GS (Sun G. S.); Liu XF (Liu X. F.); Gong QC (Gong Q. C.); Wang L (Wang L.); Zhao WS (Zhao W. S.); Li JY (Li J. Y.); Zeng YP (Zeng Y. P.); Li JM (Li J. M.)
收藏  |  浏览/下载:44/0  |  提交时间:2010/04/11
Morphological defects and uniformity issues of 4H-SiC homoepitaxial layers grown on off-oriented (0001)Si faces 会议论文
11th conference on defects recognition imaging and physics in semiconductors, beijing, peoples r china, sep 13-19, 2005
Sun, GS (Sun, G. S.); Liu, XF (Liu, X. F.); Gong, QC (Gong, Q. C.); Wang, L (Wang, L.); Zhao, WS (Zhao, W. S.); Li, JY (Li, J. Y.); Zeng, YP (Zeng, Y. P.); Li, JM (Li, J. M.)
收藏  |  浏览/下载:166/18  |  提交时间:2010/03/29
4H-SiC  
Preparation and characterization of erbium doped sol-gel silica glasses 会议论文
conference on rare-earth-doped materials and devices iii, san jose, ca, jan 27-28, 1999
Lei HB; Yang QQ; Ou HY; Chen BW; Yu JZ; Wang QM; Xie DT; Wu JG; Xu DF; Xu GX
收藏  |  浏览/下载:14/0  |  提交时间:2010/10/29
Structure and device characteristics of AlxGa1-xAs/GaAs solar cells 期刊论文
journal of crystal growth, 1996, 卷号: 162, 期号: 0, 页码: 43-47
Li B; Xiang XB; You ZP; Xu Y; Fei XY
收藏  |  浏览/下载:11/0  |  提交时间:2010/11/17
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