CORC

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CORC

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High quality microcrystalline Si films by hydrogen dilution profile 期刊论文
thin solid films, 2006, 卷号: 515, 期号: 2, 页码: 452-455
Gu JH (Gu Jinhua); Zhu MF (Zhu Meifang); Wang LJ (Wang Liujiu); Liu FZ (Liu Fengzhen); Zhou BQ (Zhou Bingqing); Ding K (Ding Kun); Li GH (Li Guohua)
收藏  |  浏览/下载：38/0  |  提交时间：2010/04/11
Electron resonant tunneling through InAs/GaAs quantum dots embedded in a Schottky diode with an AlAs insertion layer 期刊论文
journal of the electrochemical society, 2006, 卷号: 153, 期号: 7, 页码: g703-g706
作者:  Ye XL;  Xu B;  Jin P
收藏  |  浏览/下载：90/0  |  提交时间：2010/04/11
Structural and photoluminescent properties of ternary Zn1-xCdxO crystal films grown on Si(111) substrates 期刊论文
journal of crystal growth, 2003, 卷号: 256, 期号: 1-2, 页码: 78-82
Ye ZZ; Ma DW; He JH; Huang JY; Zhao BH; Luo XD; Xu ZY
收藏  |  浏览/下载：487/1  |  提交时间：2010/08/12
Structural characterization of cubic GaN grown on GaAs(001) substrates 期刊论文
chinese journal of electronics, 2001, 卷号: 10, 期号: 2, 页码: 219-222
Zheng XH; Qu B; Wang YT; Yang H; Liang JW; Han JY
收藏  |  浏览/下载：93/4  |  提交时间：2010/08/12
X-ray double-crystal characterization of the strain relaxation in GaAs/GaNxAs1-x/GaAs(001) sandwiched structures 期刊论文
journal of crystal growth, 2000, 卷号: 217, 期号: 1-2, 页码: 26-32
Pan Z; Wang YT; Li LH; Zhang W; Lin YW; Zhou ZQ; Wu RH
收藏  |  浏览/下载：48/0  |  提交时间：2010/08/12
Point defects in III-V compound semiconductors 期刊论文
defects and diffusion in semiconductors, 2000, 卷号: 183-1, 期号: 0, 页码: 85-93
Chen N
收藏  |  浏览/下载：44/0  |  提交时间：2010/08/12
Triclinic deformation and anisotropic strain relaxation of an InAs film on a GaAs(001) substrate measured by a series of symmetric double crystal X-ray diffraction 期刊论文
journal of crystal growth, 1998, 卷号: 191, 期号: 4, 页码: 627-630
Wang HM; Zeng YP; Zhou HW; Kong MY
收藏  |  浏览/下载：52/0  |  提交时间：2010/08/12
INVESTIGATION OF GAAS/SI MATERIAL BY X-RAY DOUBLE-CRYSTAL DIFFRACTION 期刊论文
journal of applied physics, 1991, 卷号: 70, 期号: 8, 页码: 4172-4175
LI CR; MAI ZH; CUI SF; ZHOU JM; WANG YT
收藏  |  浏览/下载：17/0  |  提交时间：2010/11/15

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