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Low defect thick homoepitaxial layers grown on 4H-SiC wafers for 6500 V JBS devices 会议论文
Asia-Pacific Conference on Silicon Carbide and Related Materials, APCSCRM 2018, Beijing, China, 2018-07-09
作者:  Niu, Yingxi;  Tang, Xiaoyan;  Tian, Lixin;  Zheng, Liu;  Zhang, Wenting
收藏  |  浏览/下载:8/0  |  提交时间:2019/12/20
Online Inspection Method of Defect Dimension of Stainless Steel Precision Blanking Sheet Contour 会议论文
2nd International Symposium on Application of Materials Science and Energy Materials, SAMSE 2018, Shanghai, China, 2018-12-17
作者:  Shi, Weichao;  Zheng, Jianming;  Wang, Lijie
收藏  |  浏览/下载:3/0  |  提交时间:2019/12/20
A NOVEL EFFICIENT APPROACH FOR DEFECT DETECTION IN PIPELINE STRUCTURES USING GUIDED ULTRASONIC WAVES 会议论文
PROCEEDINGS OF THE 2019 13TH SYMPOSIUM ON PIEZOELECTRICITY, ACOUSTIC WAVES AND DEVICE APPLICATIONS (SPAWDA), 2019-01-01
作者:  Da, Yi-hui;  Dong, Gui-rong;  Wang, Bin;  Liu, Dian-zi;  Qian, Zheng-hua
收藏  |  浏览/下载:5/0  |  提交时间:2019/12/20


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