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Effect of thermal stress on the electrical properties of TSV inductor 会议论文
2019 IEEE INTERNATIONAL CONFERENCE ON ELECTRON DEVICES AND SOLID-STATE CIRCUITS (EDSSC), 2019-01-01
作者:  Wang, Fengjuan;  Liu, Jingting;  Yu, Ningmei
收藏  |  浏览/下载:11/0  |  提交时间:2019/12/20
Electrical Resistivity Model for SSTA of Cu Nanowires 会议论文
2019 IEEE INTERNATIONAL CONFERENCE ON ELECTRON DEVICES AND SOLID-STATE CIRCUITS (EDSSC), 2019-01-01
作者:  Li, Jianwei;  Dai, Li;  Yu, Ningmei
收藏  |  浏览/下载:4/0  |  提交时间:2019/12/20


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