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浏览/检索结果: 共15条，第1-10条 帮助 限定条件 发表日期：2013    专题：北京大学    第一署名单位    第一作者单位    通讯作者单位     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Research and design of a power management chip for wireless powering capsule endoscopy 期刊论文 microelectronics reliability, 2013 Chen, Jianguang; Feng, Liang; Cheng, Yuhua 收藏  |  浏览/下载：3/0  |  提交时间：2015/11/10 WAVE CMOS RECTIFIER  BIOMEDICAL APPLICATIONS  BACK TELEMETRY  DEVICES   Low Leakage Current and High-Cutoff Frequency AlGaN/GaN MOSHEMT Using Submicrometer-Footprint Thermal Oxidized TiO2/NiO as Gate Dielectric 期刊论文 ieee electron device letters, 2013 Meng, Di; Lin, Shuxun; Wen, Cheng P.; Wang, Maojun; Wang, Jinyan; Hao, Yilong; Zhang, Yaohui; Lau, Kei May; Wu, Wengang 收藏  |  浏览/下载：3/0  |  提交时间：2015/11/10 AlGaN/GaN  cutoff frequency  metal oxide semiconductor high electron mobility transistor (MOSHEMT)  thermal oxidized TiO2  FIELD-EFFECT TRANSISTORS  AL2O3  LAYER  HEMTS   A simple leakage current model for polycrystalline silicon nanowire thin-film transistors 其他 2013-01-01 He, Hongyu; He, Jin; Deng, Wanling; Wang, Hao; Hu, Yue; Zhu, Xiaoan; Zheng, Xueren 收藏  |  浏览/下载：4/0  |  提交时间：2015/11/17 Leakage Power Reduction of Adiabatic Circuits Based on FinFET Devices 期刊论文 ieice transactions on electronics, 2013 Liao, Kai; Cui, XiaoXin; Liao, Nan; Ma, KaiSheng 收藏  |  浏览/下载：5/0  |  提交时间：2015/11/13 leakage current reduction  adiabatic circuits  FinFETs  power consumption  limiting frequency  noise immunity  LOGIC  VLSI   A Compact Diode Array Model for Phase Change Memory Application 期刊论文 journal of computational and theoretical nanoscience, 2013 Su, Yanmei; Ye, Yue; Wang, Cheng; He, Hongyu; Liang, Hailang; Wang, Hao; He, Jin 收藏  |  浏览/下载：1/0  |  提交时间：2015/11/13 PCM  PN Diode Array  Physical Compact Model  TEMPERATURE  SILICON  DEVICE   Back-Gate Bias Dependence of the Statistical Variability of FDSOI MOSFETs With Thin BOX 期刊论文 ieee电子器件汇刊, 2013 Yang, Yunxiang; Markov, Stanislav; Cheng, Binjie; Zain, Anis Suhaila Mohd; Liu, Xiaoyan; Asenov, Asen 收藏  |  浏览/下载：4/0  |  提交时间：2015/11/13 Back-gate bias  line edge roughness (LER)  metal gate granularity (MGG)  random dopant fluctuation (RDF)  statistical variability (SV)  thin buried oxide (BOX)  INTRINSIC PARAMETER FLUCTUATIONS  SIMULATION  DECANANOMETER  IMPACT   High Performance Aluminum-Doped ZnO Thin Film Transistors with High-K Gate Dielectrics Fabricated at Low Temperature 期刊论文 sensor letters, 2013 Han, Dedong; Cai, Jian; Wang, Wei; Wang, Liangliang; Wang, Yi; Liu, Lifeng; Zhang, Shengdong 收藏  |  浏览/下载：4/0  |  提交时间：2015/11/13 High Performance  Aluminum-Doped Zinc Oxide  Thin-Film Transistor  High-K  Low-Temperature Processing  ROOM-TEMPERATURE   High performance aluminum-doped ZnO thin film transistors with high-K gate dielectrics fabricated at low temperature 其他 2013-01-01 Han, Dedong; Cai, Jian; Wang, Wei; Wang, Liangliang; Wang, Yi; Liu, Lifeng; Zhang, Shengdong 收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03 Study on wurtzite-Sc(x)AI(1-x)N thin film : A review 其他 2013-01-01 Jia Yubin 收藏  |  浏览/下载：4/0  |  提交时间：2015/11/13 piezoelectric response  piezoelectric modulus  leakage current  w-Sc(x)AI(1-x)N alloy  ab initio theory  fist-principle   Novel Gate-Voltage-Bias Techniques for Gate-Coupled MOS (GCMOS) ESD Protection Circuits 其他 2013-01-01 Lu, Guangyi; Wang, Yuan; Cao, Jian; Jia, Song; Zhang, Ganggang; Zhang, Xing 收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13