Atomic force microscope scanning head with 3-dimensional orthogonal scanning to eliminate the curved coupling. | |
Shi, Y.a,b; Li, W.b; Gao, S.b; Lu, M.b; Hu, X.a | |
刊名 | Ultramicroscopy
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2018 | |
卷号 | Vol.190页码:77-80 |
URL标识 | 查看原文 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/2895304 |
专题 | 天津大学 |
作者单位 | 1.aState Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin, 300072, China 2.bNational Institute of Metrology, Beijing, 100029, China |
推荐引用方式 GB/T 7714 | Shi, Y.a,b,Li, W.b,Gao, S.b,et al. Atomic force microscope scanning head with 3-dimensional orthogonal scanning to eliminate the curved coupling.[J]. Ultramicroscopy,2018,Vol.190:77-80. |
APA | Shi, Y.a,b,Li, W.b,Gao, S.b,Lu, M.b,&Hu, X.a.(2018).Atomic force microscope scanning head with 3-dimensional orthogonal scanning to eliminate the curved coupling..Ultramicroscopy,Vol.190,77-80. |
MLA | Shi, Y.a,b,et al."Atomic force microscope scanning head with 3-dimensional orthogonal scanning to eliminate the curved coupling.".Ultramicroscopy Vol.190(2018):77-80. |
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