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Structure disorder degree of polysilicon thin films grown by different processing: Constant C from Raman spectroscopy 期刊论文
Journal of Applied Physics, 2013, 卷号: 114, 期号: 18
作者:  Wang, Quan;  Zhang, Yanmin;  Hu, Ran;  Ge, Daohan;  Ren, Naifei
收藏  |  浏览/下载:12/0  |  提交时间:2015/10/20


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