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Scalability and reliability of TaN/HfN/HfO(2) gate stacks fabricated by a high temperature process 其他
2005-01-01
Kang, JF; Yu, HY; Ren, C; Yang, H; Sa, N; Liu, XY; Han, RQ; Li, MF; Chan, DSH; Kwong, DL
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/13
Charactcristics of sub-1 nm CVID HfO2 gate dielectrics with HfN electrodcs for advanccd CMOS applications 其他
2004-01-01
Kang, JF; Yu, HY; Ren, C; Wang, XP; Li, MF; Chan, DSH; Liu, XY; Han, RQ; Wang, YY; Kwong, DL
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/13
TDDB characteristics of ultra-thin HfN/HfO2 gate stack 其他
2004-01-01
Yang, H; Sa, N; Tang, L; Liu, XY; Kang, JF; Han, RQ; Yu, HY; Ren, C; Li, MF; Chan, DSH; Kwong, DL
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/13
The design of an IEEE802.11 WLAN hardware MAC 其他
2004-01-01
Jiang, AP; Ren, F; Li, G; Pang, YD; Ban, T; Gou, WZ; Wang, XN; Wu, XY; Chen, HM; Zhang, GX
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/13
IEEE802.11  WLAN  MAC  
Interior singularity problem of some nonlinear elliptic equations 其他
2002-01-01
Ren, YX; Suo, XY; Yu, XD
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/11


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