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浏览/检索结果: 共4条，第1-4条 帮助 限定条件 内容类型：其他     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择发表日期升序发表日期降序提交时间升序提交时间降序题名升序题名降序作者升序作者降序 Investigation on the Amplitude Distribution of Random Telegraph Noise (RTN) in Nanoscale MOS Devices 其他 2016-01-01 Zhang, Zexuan; Guo, Shaofeng; Jiang, Xiaobo; Wang, Runsheng; Huang, Ru; Zou, Jibin 收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03 Random telegraph noise (RTN)  Amplitude distribution   New understanding of state-loss in complex RTN: Statistical experimental study, trap interaction models, and impact on circuits 其他 2015-01-01 Zou, Jibin; Wang, Runsheng; Guo, Shaofeng; Luo, Mulong; Yu, Zhuoqing; Jiang, Xiaobo; Ren, Pengpeng; Wang, Jianping; Liu, Jinhua; Wu, Jingang; Wong, Waisum; Yu, Shaofeng; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan; Huang, Ru 收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03 New Observations on Complex RTN in Scaled High-kappa/Metal-gate MOSFETs - the Role of Defect Coupling under DC/AC Condition 其他 2013-01-01 Ren, Pengpeng; Hao, Peng; Liu, Changze; Wang, Runsheng; Jiang, Xiaobo; Qin, Yingxin; Huang, Ru; Guo, Shaofeng; Luo, Mulong; Zou, Jibin; Li, Meng; Wang, Jianping; Wu, Jingang; Liu, Jinhua; Bu, Weihai; Wong, Waisum; Yu, Scott; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan 收藏  |  浏览/下载：3/0  |  提交时间：2015/11/13 New observations on complex RTN in scaled high-��/metal-gate MOSFETs - The role of defect coupling under DC/AC condition 其他 2013-01-01 Ren, Pengpeng; Hao, Peng; Liu, Changze; Wang, Runsheng; Jiang, Xiaobo; Qiu, Yingxin; Huang, Ru; Guo, Shaofeng; Luo, Mulong; Zou, Jibin; Li, Meng; Wang, Jianping; Wu, Jingang; Liu, Jinhua; Bu, Weihai; Wong, Waisum; Yu, Scott; Wu, Hanming; Lee, Shiuh-Wuu; Wang, Yangyuan 收藏  |  浏览/下载：2/0  |  提交时间：2015/11/13