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浏览/检索结果: 共12条，第1-10条 帮助 限定条件 内容类型：其他     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择发表日期升序发表日期降序提交时间升序提交时间降序题名升序题名降序作者升序作者降序 Probabilistic Graph Embedding for Unsupervised Domain Adaptation 其他 2018-01-01 作者:  Xiao, Pan;  Du, Bo;  Yun, Shuang;  Li, Xue;  Zhang, YiPeng 收藏  |  浏览/下载：4/0  |  提交时间：2019/12/05 Paraliobacillus sediminis sp. nov., isolated from East China sea sediment (vol 67, pg 1577, 2017) 其他 2017-08-01 作者:  Cao, Wen-Rui;  Guo, Ling-Yun;  Du, Zong-Jun;  Das, Anindita;  Saren, Gaowa 收藏  |  浏览/下载：6/0  |  提交时间：2019/08/19 Genomic analysis of oesophageal squamous-cell carcinoma identifies alcohol drinking-related mutation signature and genomic alterations 其他 2017-01-01 Chang, Jiang; Tan, Wenle; Ling, Zhiqiang; Xi, Ruibin; Shao, Mingming; Chen, Mengjie; Luo, Yingying; Zhao, Yanjie; Liu, Yun; Huang, Xiancong; Xia, Yuchao; Hu, Jinlin; Parker, Joel S.; Marron, David; Cui, Qionghua; Peng, Linna; Chu, Jiahui; Li, Hongmin; Du, Zhongli; Han, Yaling; Tan, Wen; Liu, Zhihua; Zhan, Qimin; Li, Yun; Mao, Weimin; Wu, Chen; Lin, Dongxin 收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03 HUMAN CANCERS  LUNG-CANCER  STRUCTURAL VARIATIONS  SUSCEPTIBILITY LOCI  WIDE ASSOCIATION  TUMOR-SUPPRESSOR  PROSTATE-CANCER  POOR-PROGNOSIS  LANDSCAPE  DISCOVERY   Reliability investigation of high-k/metal gate in nMOSFETs by three-dimensional kinetic Monte-Carlo simulation with multiple trap interactions 其他 2016-01-01 Li, Yun; Jiang, Hai; Lun, Zhiyuan; Wang, Yijiao; Huang, Peng; Hao, Hao; Du, Gang; Zhang, Xing; Liu, Xiaoyan 收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03 OXIDE  MODEL  BIAS  DEGRADATION  TECHNOLOGY  DEFECTS  STACKS  NOISE  PBTI  HFO2   Evaulation the Degradation in nMOSFETs with HfO2 Gate Dielectric and Interfacial Layer by 3D Kinetic Monte-Carlo Method 其他 2016-01-01 Li, Yun; Lun, Zhiyuan; Wang, Yijiao; Huang, Peng; Jiang, Hai; Zhang, Xing; Du, Gang; Liu, Xiaoyan 收藏  |  浏览/下载：2/0  |  提交时间：2017/12/03 Comprehensive Understanding of Hot Carrier Degradation in Multiple-fin SOI FinFETs 其他 2015-01-01 Jiang, Hai; Yin, Longxiang; Li, Yun; Xu, Nuo; Zhao, Kai; He, Yandong; Du, Gang; Liu, Xiaoyan; Zhang, Xing 收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03 multi-gate FET  Silicon-on-Insulator  hot carrier  interface charge  oxide charge  reliability  REGIME   Simulation of Positive Bias Temperature Instability (PBTI) in high-k FinFET by KMC method 其他 2015-01-01 Li, Yun; Wang, Yijiao; Jiang, Hai; Du, Gang; Kang, Jinfeng; Liu, Xiaoyan 收藏  |  浏览/下载：3/0  |  提交时间：2017/12/03 Ultra-High 435-bit/s/Hz Spectral Efficiency Using N-Dimentional Multiplexing and Modulation Link with Pol-Muxed 52 Orbital Angular Momentum (OAM) Modes Carrying Nyquist 32-QAM Signals 其他 2015-01-01 Wang, Jian; Liu, Jun; Lv, Xin; Zhu, Long; Wang, Dan; Li, Shuhui; Wang, Andong; Zhao, Yifan; Long, Yun; Du, Jing; Hu, Xiao; Zhou, Nan; Chen, Shi; Fang, Liang; Zhang, Fan 收藏  |  浏览/下载：5/0  |  提交时间：2017/12/03 Ultra-high 435-bit/s/Hz spectral efficiency using N-dimentional multiplexing and modulation link with pol-muxed 52 orbital angular momentum (OAM) modes carrying Nyquist 32-QAM signals 其他 2015-01-01 Wang, Jian; Liu, Jun; Lv, Xin; Zhu, Long; Wang, Dan; Li, Shuhui; Wang, Andong; Zhao, Yifan; Long, Yun; Du, Jing; Hu, Xiao; Zhou, Nan; Chen, Shi; Fang, Liang; Zhang, Fan 收藏  |  浏览/下载：4/0  |  提交时间：2017/12/03 3D KMC reliability simulation of nano-scaled HKMG nMOSFETs with multiple traps coupling 其他 2015-01-01 Li, Yun; Lun, Zhiyuan; Huang, Peng; Wang, Yijiao; Jiang, Hai; Du, Gang; Liu, Xiaoyan 收藏  |  浏览/下载：8/0  |  提交时间：2017/12/03