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Chapter 5:Passivation and Characterization in High-k/III–V Interfaces in book entitled Outlook and Challenges of Nano Devices,Sensors, and MEMS 专著
:Springer, 2017
作者:  刘洪刚;  王盛凯
收藏  |  浏览/下载:10/0  |  提交时间:2018/03/01


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