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CORC

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0.18 微米嵌入式闪存总剂量辐射效应研究 学位论文
博士: 中国科学院研究生院（上海微系统与信息技术研究所）  , 2012
胡志远
收藏  |  浏览/下载：19/0  |  提交时间：2013/04/24
Radiation-induced shallow trench isolation leakage in 180-nm flash memory technology 期刊论文
MICROELECTRONICS RELIABILITY, 2012, 卷号: 52, 期号: 1, 页码: 130-136
Ning, BX; Zhang, ZX; Liu, ZL; Hu, ZY; Chen, M; Bi, DW; Zou, SC
收藏  |  浏览/下载：14/0  |  提交时间：2013/04/17
Analysis of bias effects on the total ionizing dose response in a 180 nm technology 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2011, 卷号: 644, 期号: 1, 页码: 48-54
Liu,ZL; Hu,ZY; Zhang,ZX; Shao,H; Chen,M; Bi,DW; Ning,BX; Zou,SC
收藏  |  浏览/下载：9/0  |  提交时间：2012/04/10
Total ionizing dose effects in elementary devices for 180-nm flash technologies 期刊论文
MICROELECTRONICS RELIABILITY, 2011, 卷号: 51, 期号: 8, 页码: 1295-1301
Hu,ZY; Liu,ZL; Shao,H; Zhang,ZX; Ning,BX; Chen,M; Bi,DW; Zou,SC
收藏  |  浏览/下载：16/0  |  提交时间：2012/04/10
Influence of poly region extended into field oxide on total ionizing dose effect for deep submicron MOSFET 期刊论文
Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS.RADECS 2011 - 12th European Conference on Radiation and Its Effects on Component and Systems, Conference Proceedings, 2011, 期号: 0, 页码: 28-35
Liu, ZL; Hu, ZY; Zhang, ZX; Shao, H; Ning, Bingxu; Chen, M; Bi, Dawei; Zou, SC
收藏  |  浏览/下载：26/0  |  提交时间：2012/08/28
Analysis of bias effects on the total ionizing dose response in a 180 nm technology 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2011, 卷号: 644, 期号: 1, 页码: 48-54
Liu, ZL; Hu, ZY; Zhang, Z（重点实验室）X; Shao, H; Chen, M; Bi, DW; Ning, BX; Zou, SC（重点实验室）
收藏  |  浏览/下载：16/0  |  提交时间：2013/05/10
Fabrication of Total-Dose-Radiation-Hardened (TDRH) SOI wafer with embedded silicon nanoclusters 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2009, 卷号: 267, 期号: 8-9, 页码: 1489-1491
Wu, AM; Wang, X; Wei, X; Chen, J; Chen, M; Zhang, ZX
收藏  |  浏览/下载：17/0  |  提交时间：2012/03/24
Total dose radiation effects of Pt/PZT/Pt ferroelectric capacitors fabricated by PLD method 期刊论文
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1999, 卷号: 14, 期号: 9, 页码: 836-839
Gao, JX; Zheng, LR; Huang, BP; Song, ZT; Yang, LX; Fan, YJ; Zhu, DZ; Lin, CL
收藏  |  浏览/下载：28/0  |  提交时间：2012/03/25
Total dose radiation effects of Au/PbZr0.52Ti0.48O3/YBa2Cu3O7-delta capacitors 期刊论文
THIN SOLID FILMS, 1999, 卷号: 340, 期号: 1-2, 页码: 132-136
Gao, JX; Zheng, LR; Duo, XZ; Huang, JP; Yang, LX; Lin, CL; Yan, RL
收藏  |  浏览/下载：15/0  |  提交时间：2012/03/25
Total dose radiation effects of Au/PbZr0.52Ti0.48O3/YBa2Cu3O7-delta/LaAlO3 ferroelectric capacitors 期刊论文
RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1998, 卷号: 145, 期号: 4, 页码: 319-327
Gao, JX; Zheng, LR; Duo, XZ; Huang, JP; Lin, CL; Yan, RL
收藏  |  浏览/下载：12/0  |  提交时间：2012/03/25

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