CORC

浏览/检索结果: 共2条,第1-2条 帮助

限定条件    
已选(0)清除 条数/页:   排序方式:
Characterization of defects and whole wafer uniformity of annealed undoped semi-insulating InP wafers 会议论文
9th international conference on defects: recognition, imaging and physics in semiconductors (drip ix), rimini, italy, sep 24-28, 2001
Zhao YW; Sun NF; Dong HW; Jiao JH; Zhao JQ; Sun TN; Lin LY
收藏  |  浏览/下载:14/0  |  提交时间:2010/11/15
Characterization of defects and whole wafer uniformity of annealed undoped semi-insulating InP wafers 期刊论文
materials science and engineering b-solid state materials for advanced technology, 2002, 卷号: 91, 期号: 0, 页码: 521-524
Zhao YW; Sun NF; Dong HW; Jiao JH; Zhao JQ; Sun TN; Lin LY
收藏  |  浏览/下载:82/19  |  提交时间:2010/08/12


©版权所有 ©2017 CSpace - Powered by CSpace