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Investigation of GaAs/AlGaAs interfaces by reflectance-difference spectroscopy 会议论文
10th international conference on defects - recognition, imaging and physics in semiconductors (drip 10), batz sur mer, france, sep 29-oct 02, 2003
作者:  Ye XL;  Xu B
收藏  |  浏览/下载:11/0  |  提交时间:2010/10/29
Investigation of GaN layer grown on Si(111) substrate using an ultrathin AlN wetting layer 期刊论文
journal of crystal growth, 2002, 卷号: 236, 期号: 1-3, 页码: 77-84
作者:  Han PD
收藏  |  浏览/下载:74/5  |  提交时间:2010/08/12
Triclinic deformation and anisotropic strain relaxation of an InAs film on a GaAs(001) substrate measured by a series of symmetric double crystal X-ray diffraction 期刊论文
journal of crystal growth, 1998, 卷号: 191, 期号: 4, 页码: 627-630
Wang HM; Zeng YP; Zhou HW; Kong MY
收藏  |  浏览/下载:52/0  |  提交时间:2010/08/12
A study of the interface of CeO2/Si heterostructure grown by ion beam deposition 期刊论文
vacuum, 1998, 卷号: 51, 期号: 3, 页码: 397-401
Wu ZL; Huang DD; Yang XZ
收藏  |  浏览/下载:37/0  |  提交时间:2010/08/12


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