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Combined frequency- and time-domain photocarrier radiometry characterization of ion-implanted and thermally annealed silicon wafers 期刊论文
Chinese Physics B, 2013, 卷号: 22, 期号: 5, 页码: 057202
作者:  Ren, Sheng-Dong;  Li, Bin-Cheng;  Gao, Li-Feng;  Wang, Qian
收藏  |  浏览/下载:13/0  |  提交时间:2016/11/21


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