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Physics-based modeling of gate-leakage current in AlGaN/GaN high electron mobility transistors 会议论文
Kyoto, Japan, July 6, 2016 - July 8, 2016
作者:  Ma, Xiaoyu[1];  Yu, Fei[1];  Deng, Wanling[1];  Huang, Junkai[1]
收藏  |  浏览/下载:1/0  |  提交时间:2019/12/17
Physics-based Modeling of Gate-leakage Current in AlGaN/GaN High Electron Mobility Transistors 会议论文
Ryukoku Univ, Kyoto, JAPAN, JUL 06-08, 2016
作者:  Ma, Xiaoyu[1];  Yu, Fei[1];  Deng, Walling[1];  Huang, Junkai[1]
收藏  |  浏览/下载:1/0  |  提交时间:2019/12/17


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