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长春光学精密机械与物... [4]
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期刊论文 [3]
会议论文 [1]
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2017 [1]
2012 [2]
2006 [1]
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专题:长春光学精密机械与物理研究所
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An Automatic Corona-discharge Detection System for Railways Based on Solar-blind Ultraviolet Detection
期刊论文
Current Optics and Photonics, 2017, 卷号: 1, 期号: 3
作者:
Li, J. Q.
;
Y. Zhou
;
X. Y. Yi
;
M. C. Zhang
;
X. Chen
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  |  
浏览/下载:21/0
  |  
提交时间:2018/06/13
Application of Near-Infrared Topology Method in the Quality Analysis of Jujube of Southern Xinjiang
期刊论文
Spectroscopy and Spectral Analysis, 2012, 卷号: 32, 期号: 3, 页码: 655-659
Luo H. P.
;
Lu Q. P.
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  |  
浏览/下载:15/0
  |  
提交时间:2012/10/21
Study on Online Detection Modeling Parameters of Jujube Internal Quality of Southern Xinjiang with Near Infrared Spectrometric Techniques
期刊论文
Spectroscopy and Spectral Analysis, 2012, 卷号: 32, 期号: 5, 页码: 1225-1229
Luo H. P.
;
Lu Q. P.
;
Ding H. Q.
;
Gao H. Z.
;
Guo L.
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  |  
浏览/下载:13/0
  |  
提交时间:2012/10/21
Analysis of a precise instrument for measuring reference level involute (EI CONFERENCE)
会议论文
Third International Symposium on Precision Mechanical Measurements, August 2, 2006 - August 6, 2006, Xinjiang, China
Lou Z.
;
Wang L.
;
Wang X.
;
Ma Y.
;
Zhang Y.
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  |  
浏览/下载:17/0
  |  
提交时间:2013/03/25
Reference level involute is used for evaluating other involutes
but it is very difficult to measure reference level involute exactly. Nowadays the available methods for measuring precise involute include single base disc mode
electronic generation mode
and CNC three-coordinate mode. But measurement accuracy of the modes above is not suitable for reference level involute. A precise instrument for measuring reference level involute
double base discs instrument
is introduced. It is consistent with generation principle of the involute entirely. Besides having the advantages of single basic disc instrument
the instrument can remove Abbe error caused by the stylus
and has no pressure deforming. The instrument's structure is described. The main sources of measurement errors are analyzed and methods for compensation are presented. Finally
uncertainty of the instrument is given
which meets reference level involute test specification.
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