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Electromigration in Al interconnects and the challenges in ultra-deep submicron technology 期刊论文
ACTA PHYSICA SINICA, 2006, 卷号: 55, 期号: 10, 页码: 5424-5434
Zhang, WJ(张文杰); Yi, WB(易万兵); Wu, J(吴瑾)
收藏  |  浏览/下载:12/0  |  提交时间:2012/03/24
Microstructural and electrical properties of ZrO2 thin films prepared on silicon on insulator with thin top silicon 期刊论文
CHINESE PHYSICS LETTERS, 2003, 卷号: 20, 期号: 2, 页码: 273-276
Zhang, NL; Song, ZT; Shen, QW; Lin, CL
收藏  |  浏览/下载:7/0  |  提交时间:2012/03/24


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