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浏览/检索结果: 共5条，第1-5条 帮助 限定条件 发表日期：2013     已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 A simple leakage current model for polycrystalline silicon nanowire thin-film transistors 其他 2013-01-01 He, Hongyu; He, Jin; Deng, Wanling; Wang, Hao; Hu, Yue; Zhu, Xiaoan; Zheng, Xueren 收藏  |  浏览/下载：4/0  |  提交时间：2015/11/17 Study on silicon window polarity of partial-SOI LDMOS power devices 期刊论文 Proceedings of the 5th Asia Symposium on Quality Electronic Design, ASQED 2013, 2013 作者:  Du, Caixia;  Zhong, Shengju;  Hu, Yue;  Wang, Hao;  Wang, Cheng 收藏  |  浏览/下载：3/0  |  提交时间：2019/12/05 Continuum damage mechanism-based life prediction for Ni-based superalloy under complex loadings 期刊论文 MATERIALS AT HIGH TEMPERATURES, 2013, 卷号: 30, 页码: 287-294 作者:  Shi, Duoqi;  Hu, Xiaoan;  Yang, Xiaoguang;  Liu, Jinlong 收藏  |  浏览/下载：1/0  |  提交时间：2020/01/06 continuum damage mechanism  directionally solidified superalloy  blade  complex loading  high temperature   LCF behavior and life modeling of DZ125 under complicated load condition at high temperature 会议论文 13th International Conference on Fracture 2013, ICF 2013, Beijing, China, 2013-06-16 作者:  Xiaoguang, Yang;  Jia, Huang;  Duoqi, Shi;  Xiaoan, Hu;  Chengli, Dong 收藏  |  浏览/下载：2/0  |  提交时间：2020/01/06 A Simple Leakage Current Model for Polycrystalline Silicon Nanowire Thin-Film Transistors 期刊论文 2013 IEEE INTERNATIONAL CONFERENCE OF ELECTRON DEVICES AND SOLID-STATE CIRCUITS (EDSSC), 2013, 页码: 1-2 作者:  He, Hongyu*;  He, Jin;  Deng, Wanling;  Wang, Hao;  Hu, Yue 收藏  |  浏览/下载：5/0  |  提交时间：2019/12/27 Thin-film transistor (TFT)  polycrystalline silicon (poly-Si)  nanowire  leakage current  thermal field emission