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Absolute measurement of roughness and lateral-correlation length of random surfaces by use of the simplified model of image-speckle contrast 期刊论文
2002, 卷号: 41, 期号: 20, 页码: 4148-4156
作者:  Cheng, CF[1];  Liu, CX[2];  Zhang, NY[3];  Jia, TQ;  Li, RX
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