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半导体研究所 [3]
兰州理工大学 [1]
兰州大学 [1]
金属研究所 [1]
西安理工大学 [1]
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期刊论文 [4]
会议论文 [3]
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2012 [2]
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2003 [3]
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chemical r... [1]
半导体材料 [1]
半导体物理 [1]
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In-situ stress suppression of hydrogenated a-CNxfilm prepared via Ar gas introduction
期刊论文
Surface and Interface Analysis, 2016
作者:
Wang, Qi
;
He, Deyan
;
Zhang, Junyan
收藏
  |  
浏览/下载:3/0
  |  
提交时间:2017/01/13
Compressive stress
Amorphous carbon
Amorphous films
Argon
Carbon films
Carbon nitride
Graphite
Hardness
Hydrogenation
Nitrides
Stresses
Ar plasmas
Carbon nitride films
Hydrogenated amorphous carbon nitride
Insitu stress
Nitrogen content
Raman
RMS roughness
Root mean square roughness
脱氮热导法测定钛中氩
会议论文
2012国际冶金及材料分析测试学术报告会(CCATM2012), 北京, 2012-10-31
朱跃进
;
朱瑛才
收藏
  |  
浏览/下载:21/0
  |  
提交时间:2013/08/21
nitrogen-removing thermal conductivity
argon in titanium
argon content
argon releasing
The effect of Mg on the microstructure and electrochemical properties of La0.8-xGd0.2Mgx Ni3.3Co0.3Al0.1(x=0-0.4) hydrogen storage alloys
期刊论文
Gongneng Cailiao/Journal of Functional Materials, 2012, 卷号: 43, 期号: 18, 页码: 2450-2455
作者:
Guo, Xing-Bo
;
Luo, Yong-Chun
;
Gao, Zhi-Jie
;
Zhang, Guo-Qing
;
Kang, Long
收藏
  |  
浏览/下载:9/0
  |  
提交时间:2020/11/14
Aluminum
Argon
Cerium
Electrochemical properties
Gadolinium
Hydrogen
Hydrogen storage
Hydrogen storage alloys
Lithium compounds
Microstructure
X ray diffraction
Activation capability
Annealed alloys
Annealing treatments
Argon atmospheres
Charge-discharge cycle
Discharge capacities
Electrochemical measurements
Equilibrium pressure
High purity
Hydrogen absorption
Hydrogen absorption properties
Hydrogen storage capacities
Induction melting
Mg content
Plateau pressures
Hydrogen Variation in Molten Steel during LF Refining
会议论文
12th International Symposium on Eco-Materials Processing and Design, Chiang Mai, THAILAND, 2011-01-08
作者:
Ju, Jiantao
;
Lv, Zhenlin
;
Zhang, Minjuan
;
Zhang, Zhaohui
;
Yang, Jun
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  |  
浏览/下载:2/0
  |  
提交时间:2019/12/20
Hydrogen content
LF refining
Argon blowing
Effects and numerical analysis of argon gas flow on the oxygen concentration in czochralski silicon single crystal growth
期刊论文
Microelectronic engineering, 2003, 卷号: 66, 期号: 1-4, 页码: 504-509
作者:
Zhang, ZC
;
Ren, BY
;
Chen, YH
;
Yang, SY
;
Wang, ZG
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  |  
浏览/下载:31/0
  |  
提交时间:2019/05/12
Czochralski method
Growth from melt
Semiconductor silicon
Argon gas flow
Computer simulation
Oxygen content
Effects and numerical analysis of argon gas flow on the oxygen concentration in Czochralski silicon single crystal growth
会议论文
iumrs/icem 2002 conference, xian, peoples r china, jun 10-14, 2002
Zhang ZC
;
Ren BY
;
Chen YH
;
Yang SY
;
Wang ZG
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  |  
浏览/下载:27/0
  |  
提交时间:2010/11/15
Czochralski method
growth from melt
semiconductor silicon
argon gas flow
computer simulation
oxygen content
FURNACE PRESSURE
Effects and numerical analysis of argon gas flow on the oxygen concentration in Czochralski silicon single crystal growth
期刊论文
microelectronic engineering, 2003, 卷号: 66, 期号: 1-4, 页码: 504-509
Zhang ZC
;
Ren BY
;
Chen YH
;
Yang SY
;
Wang ZG
收藏
  |  
浏览/下载:42/0
  |  
提交时间:2010/08/12
Czochralski method
growth from melt
semiconductor silicon
argon gas flow
computer simulation
oxygen content
FURNACE PRESSURE
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