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Analysis of a precise instrument for measuring reference level involute (EI CONFERENCE) 会议论文
Third International Symposium on Precision Mechanical Measurements, August 2, 2006 - August 6, 2006, Xinjiang, China
Lou Z.; Wang L.; Wang X.; Ma Y.; Zhang Y.
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Reference level involute is used for evaluating other involutes  but it is very difficult to measure reference level involute exactly. Nowadays the available methods for measuring precise involute include single base disc mode  electronic generation mode  and CNC three-coordinate mode. But measurement accuracy of the modes above is not suitable for reference level involute. A precise instrument for measuring reference level involute  double base discs instrument  is introduced. It is consistent with generation principle of the involute entirely. Besides having the advantages of single basic disc instrument  the instrument can remove Abbe error caused by the stylus  and has no pressure deforming. The instrument's structure is described. The main sources of measurement errors are analyzed and methods for compensation are presented. Finally  uncertainty of the instrument is given  which meets reference level involute test specification.  


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