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浏览/检索结果: 共5条，第1-5条 帮助 已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择作者升序作者降序题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序 Fast and automatic security test on cryptographic ICs against fault injection attacks based on design for security test 期刊论文 IET Information Security, 2017 作者:  Cuiping Shao;  Huiyun Li;  Jianbin Zhou 收藏  |  浏览/下载：16/0  |  提交时间：2018/02/02 SoC test data compression technique based on RLE-G (EI CONFERENCE) 会议论文 2010 International Conference on Advanced Measurement and Test, AMT 2010, May 15, 2010 - May 16, 2010, Sanya, China Deng C.; Liu W.; Zheng X.; Yang L. 收藏  |  浏览/下载：20/0  |  提交时间：2013/03/25 Test data compression has been an effective way to reduce test data volume and test time  as well as to solve automatic test equipment (ATE) memory and bandwidth limitation. We analyze the limitations of current test data compression algorithm and draw on the previous experience to deduce an optimal compression coding model suitable for SoC test data. In addition  in this paper we make full use of the relevance of the test vectors and the advantages of statistical coding to present an efficient test data compression method RLE-G based on the coding model  and give the RLE-G the optimal compression efficiency of the boundary conditions and realization steps. The experimental results for ISCAS 89 benchmark circuits demonstrate RLE-G have the excellent advantages of high compression ratio. (2010) Trans Tech Publications.   A mems probe card with 2d dense-arrayed 'hoe'-shaped metal tips 期刊论文 Journal of micromechanics and microengineering, 2008, 卷号: 18, 期号: 5, 页码: 8 作者:  Wang, Fei;  Li, Xinxin;  Feng, Songlin 收藏  |  浏览/下载：11/0  |  提交时间：2019/05/10 Embedded test decompressor to reduce the required channels and vector memory of tester for complex processor circuit 期刊论文 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2007, 卷号: 15, 期号: 5, 页码: 531-540 作者:  Han, Yinhe;  Hu, Yu;  Li, Xiaowei;  Li, Huawei;  Chandra, Anshuman 收藏  |  浏览/下载：13/0  |  提交时间：2019/12/16 automatic test equipment (ATE)  Godson processor  MUX network  test stimulus decompression   Design and Simulation of Testing Circuit for Radio Frequency Chip (CPCI-S收录) 会议论文 APPLIED MATERIALS AND TECHNOLOGIES FOR MODERN MANUFACTURING, PTS 1-4 作者:  Luo, Qing[1];  Chen, Hui;  Li, Guoyuan[1] 收藏  |  浏览/下载：3/0  |  提交时间：2019/04/15 Radio Frequency (RF)  Integrated Circuit (IC) testing  Automatic Test Equipment (ATE)  impedance matching