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Investigation of single event effect in 28-nm system-on-chip with multi patterns* 期刊论文
CHINESE PHYSICS B, 2020, 卷号: 29, 期号: 10, 页码: 5
作者:  Yang, Wei-Tao;  Li, Yong-Hong;  Guo, Ya-Xin;  Zhao, Hao-Yu;  Li, Yang
收藏  |  浏览/下载:26/0  |  提交时间:2021/12/15
Design and verification of universal evaluation system for single event effect sensitivity measurement in very-large-scale integrated circuits 期刊论文
IEICE ELECTRONICS EXPRESS, 2019, 卷号: 16, 期号: 10, 页码: 6
作者:  Xu, Liewei;  Cai, Chang;  Liu, Tianqi;  Ke, Lingyun;  Yu, Jun
收藏  |  浏览/下载:67/0  |  提交时间:2019/11/10
Heavy ion-induced single event effects in active pixel sensor array 期刊论文
SOLID-STATE ELECTRONICS, 2019, 卷号: 152, 期号: 2, 页码: 93-99
作者:  Cai, YL (Cai, Yu-Long)[ 1,2,3 ];  Guo, Q (Guo, Qi)[ 1,2 ];  Li, YD (Li, Yu-Dong)[ 1,2 ];  Wen, L (Wen, Lin)[ 1,2 ];  Zhou, D (Zhou, Dong)[ 1,2 ]
收藏  |  浏览/下载:128/0  |  提交时间:2019/01/03
Development of single-event-effects analysis system at the IMP microbeam facility 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2017, 卷号: 404, 页码: 250-253
作者:  Du, Guanghua;  Bi, Jinshun;  Ma, Shuyi;  Liu, Xiaojun;  Sheng, Lina
收藏  |  浏览/下载:26/0  |  提交时间:2018/05/31
Development of single-event-effects analysis system at the IMP microbeam facility 会议论文
作者:  Guo, Jinlong;  Ma, Shuyi;  Liu, Xiaojun;  Sheng, Lina;  Li, Yaning
收藏  |  浏览/下载:20/0  |  提交时间:2018/08/20
Development of single-event-effects analysis system at the IMP microbeam facility 会议论文
作者:  Sheng, Lina;  Guo, Jinlong;  Du, Guanghua;  Bi, Jinshun;  Liu, Wenjing
收藏  |  浏览/下载:25/0  |  提交时间:2018/08/20
Implementation and verification of different ECC mitigation designs for BRAMs in flash-based FPGAs 期刊论文
CHINESE PHYSICS C, 2016, 卷号: 40, 页码: 9
作者:  Yang, Zhen-Lei;  Wang, Xiao-Hui;  Zhang, Zhan-Gang;  Liu, Jie;  Su, Hong
收藏  |  浏览/下载:13/0  |  提交时间:2018/05/31
Experimental study on heavy ion single-event effects in flash-based FPGAs 期刊论文
NUCLEAR SCIENCE AND TECHNIQUES, 2016, 卷号: 27, 页码: 8
作者:  Liu, Tian-Qi;  Yang, Zhen-Lei;  Liu, Jie;  Wang, Xiao-Hui;  Su, Hong
收藏  |  浏览/下载:16/0  |  提交时间:2018/05/31
Single event effect hardness for the front-end ASICs in the DAMPE satellite BGO calorimeter 期刊论文
CHINESE PHYSICS C, 2016, 卷号: 40, 页码: 6
作者:  Gao, Shan-Shan;  Jiang, Di;  Feng, Chang-Qing;  Xi, Kai;  Liu, Shu-Bin
收藏  |  浏览/下载:27/0  |  提交时间:2018/05/31
A flexible and robust soft-error testing system for microelectronic devices and integrated circuits 期刊论文
NUCLEAR SCIENCE AND TECHNIQUES, 2015, 卷号: 26, 页码: 7
作者:  Gu Song;  Su Hong;  Liu Jie;  Zhang Zhan-Gang;  Tong Teng
收藏  |  浏览/下载:23/0  |  提交时间:2018/05/31


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