CORC

浏览/检索结果: 共3条,第1-3条 帮助

已选(0)清除 条数/页:   排序方式:
Random Interface Trap Induced Fluctuation in 22nm High-k/Metal Gate Junctionless and Inversion-mode FinFETs 其他
2013-01-01
Wang, Yijiao; Wei, Kangliang; Liu, Xiaoyan; Du, Gang; Kang, Jinfeng
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/13
一种用于表征亚阈值电流镜电路中CMOS工艺波动的统计学方法(英文) 期刊论文
2010, 2010
张雷; 余志平; 贺祥庆; Zhang Lei; Yu Zhiping; He Xiangqing
收藏  |  浏览/下载:1/0
Fokker-Planck description of conductance-based integrate-and-fire neuronal networks 期刊论文
physical review e, 2009
Kovacic, Gregor; Tao, Louis; Rangan, Aaditya V.; Cai, David
收藏  |  浏览/下载:7/0  |  提交时间:2015/11/16


©版权所有 ©2017 CSpace - Powered by CSpace